ISTFA 2003: proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio
ASM International
2003
|
| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (518 pages) illustrations |
| ISBN: | 9781615030866 1615030867 |
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Datensatz im Suchindex
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| spelling | International Symposium for Testing and Failure Analysis < 2003, Santa Clara, Calif.> Verfasser aut ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis sponsored by EDFAS. Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 Conference proceedings from the 29th International Symposium for Testing and Failure Analysis Materials Park, Ohio ASM International 2003 1 online resource (518 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth Erscheint auch als Druck-Ausgabe International Symposium for Testing and Failure Analysis (29th : 2002 : Santa Clara, Calif.) ISTFA 2003 Materials Park, Ohio : ASM International, 2003 0871707888 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4014346-6 (DE-588)1071861417 |
| title | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis |
| title_alt | Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 Conference proceedings from the 29th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis |
| title_exact_search | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis |
| title_full | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis sponsored by EDFAS. |
| title_fullStr | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis sponsored by EDFAS. |
| title_full_unstemmed | ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis sponsored by EDFAS. |
| title_short | ISTFA 2003 |
| title_sort | istfa 2003 proceedings of the 29th international symposium for testing and failure analysis 2 6 november 2003 santa clara convention center santa clara california conference proceedings from the 29th international symposium for testing and failure analysis |
| title_sub | proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California = Conference proceedings from the 29th International Symposium for Testing and Failure Analysis |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik Elektronik Konferenzschrift |
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