ISTFA 2006: Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH
ASM International
2006
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| Subjects: | |
| Item Description: | Print version record |
| Physical Description: | 1 online resource (xx, 524 pages) illustrations |
| ISBN: | 9781615030897 1615030891 |
Staff View
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Record in the Search Index
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| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> Verfasser aut ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2006 1 online resource (xx, 524 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses 1\p (DE-588)1071861417 Konferenzschrift gnd-content Electronic Device Failure Analysis Society Sonstige oth ASM International Sonstige oth 0871708442 9780871708441 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| title_alt | Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| title_exact_search | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| title_full | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International |
| title_fullStr | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International |
| title_full_unstemmed | ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2006, ASM International |
| title_short | ISTFA 2006 |
| title_sort | istfa 2006 proceedings of the 32nd international symposium for testing and failure analysis november 12 16 2006 renaissance austin hotel austin texas usa conference proceedings from the 32nd international symposium for testing and failure analysis |
| title_sub | Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA = Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses Konferenzschrift |
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