Advanced production testing of RF, SoC, and SiP devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Artech House
2007
|
| Schriftenreihe: | Artech House microwave library
|
| Schlagworte: | |
| Beschreibung: | Print version record |
| Beschreibung: | 1 online resource (xx, 301 pages) illustrations |
| ISBN: | 9781580537100 1580537103 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045342600 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 181206s2007 |||| o||u| ||||||eng d | ||
| 020 | |a 9781580537100 |9 978-1-58053-710-0 | ||
| 020 | |a 1580537103 |9 1-58053-710-3 | ||
| 035 | |a (ZDB-4-ENC)ocn228292434 | ||
| 035 | |a (OCoLC)228292434 | ||
| 035 | |a (DE-599)BVBBV045342600 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.3815 |2 22 | |
| 100 | 1 | |a Kelly, Joe |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced production testing of RF, SoC, and SiP devices |c Joe Kelly, Michael Engelhardt |
| 264 | 1 | |a Boston |b Artech House |c 2007 | |
| 300 | |a 1 online resource (xx, 301 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Artech House microwave library | |
| 500 | |a Print version record | ||
| 505 | 8 | |a Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |2 bisacsh | |
| 650 | 4 | |a Systems on a chip |x Testing | |
| 700 | 1 | |a Engelhardt, M. |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Kelly, Joe |t Advanced production testing of RF, SoC, and SiP devices |d Boston : Artech House, 2007 |z 158053709X |z 9781580537094 |
| 912 | |a ZDB-4-ENC | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030729303 | ||
Datensatz im Suchindex
| _version_ | 1804179160531206144 |
|---|---|
| any_adam_object | |
| author | Kelly, Joe |
| author_facet | Kelly, Joe |
| author_role | aut |
| author_sort | Kelly, Joe |
| author_variant | j k jk |
| building | Verbundindex |
| bvnumber | BV045342600 |
| collection | ZDB-4-ENC |
| contents | Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before |
| ctrlnum | (ZDB-4-ENC)ocn228292434 (OCoLC)228292434 (DE-599)BVBBV045342600 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02197nmm a2200385zc 4500</leader><controlfield tag="001">BV045342600</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">181206s2007 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781580537100</subfield><subfield code="9">978-1-58053-710-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1580537103</subfield><subfield code="9">1-58053-710-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-4-ENC)ocn228292434</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)228292434</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045342600</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kelly, Joe</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced production testing of RF, SoC, and SiP devices</subfield><subfield code="c">Joe Kelly, Michael Engelhardt</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Artech House</subfield><subfield code="c">2007</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xx, 301 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Artech House microwave library</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Print version record</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems on a chip</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Engelhardt, M.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Kelly, Joe</subfield><subfield code="t">Advanced production testing of RF, SoC, and SiP devices</subfield><subfield code="d">Boston : Artech House, 2007</subfield><subfield code="z">158053709X</subfield><subfield code="z">9781580537094</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-ENC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030729303</subfield></datafield></record></collection> |
| id | DE-604.BV045342600 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:27Z |
| institution | BVB |
| isbn | 9781580537100 1580537103 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030729303 |
| oclc_num | 228292434 |
| open_access_boolean | |
| physical | 1 online resource (xx, 301 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House microwave library |
| spelling | Kelly, Joe Verfasser aut Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt Boston Artech House 2007 1 online resource (xx, 301 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Artech House microwave library Print version record Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Systems on a chip Testing Engelhardt, M. Sonstige oth Erscheint auch als Druck-Ausgabe Kelly, Joe Advanced production testing of RF, SoC, and SiP devices Boston : Artech House, 2007 158053709X 9781580537094 |
| spellingShingle | Kelly, Joe Advanced production testing of RF, SoC, and SiP devices Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Systems on a chip Testing |
| title | Advanced production testing of RF, SoC, and SiP devices |
| title_auth | Advanced production testing of RF, SoC, and SiP devices |
| title_exact_search | Advanced production testing of RF, SoC, and SiP devices |
| title_full | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_fullStr | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_full_unstemmed | Advanced production testing of RF, SoC, and SiP devices Joe Kelly, Michael Engelhardt |
| title_short | Advanced production testing of RF, SoC, and SiP devices |
| title_sort | advanced production testing of rf soc and sip devices |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Systems on a chip Testing |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Systems on a chip Testing |
| work_keys_str_mv | AT kellyjoe advancedproductiontestingofrfsocandsipdevices AT engelhardtm advancedproductiontestingofrfsocandsipdevices |