Confocal scanning optical microscopy and related imaging systems:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
San Diego
Academic Press
1996
|
| Subjects: | |
| Item Description: | Print version record |
| Physical Description: | 1 online resource (xv, 335 pages) illustrations |
| ISBN: | 9780124087507 0124087507 9780080529783 008052978X 1281046698 9781281046697 |
Staff View
MARC
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| 100 | 1 | |a Corle, Timothy R. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Confocal scanning optical microscopy and related imaging systems |c Timothy R. Corle, Gordon S. Kino |
| 264 | 1 | |a San Diego |b Academic Press |c 1996 | |
| 300 | |a 1 online resource (xv, 335 pages) |b illustrations | ||
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| 505 | 8 | |a This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Key Features * Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers * Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology * Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations * Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications * Discusses the theory and design of near-field optical microscopes * Explains phase imaging in the scanning optical and interference microscopes | |
| 650 | 7 | |a SCIENCE / Microscopes & Microscopy |2 bisacsh | |
| 650 | 7 | |a Confocal microscopy |2 fast | |
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| 700 | 1 | |a Kino, Gordon S. |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Corle, Timothy R. |t Confocal scanning optical microscopy and related imaging systems |d San Diego : Academic Press, 1996 |z 0124087507 |z 9780124087507 |
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Record in the Search Index
| _version_ | 1804179158693052416 |
|---|---|
| any_adam_object | |
| author | Corle, Timothy R. |
| author_facet | Corle, Timothy R. |
| author_role | aut |
| author_sort | Corle, Timothy R. |
| author_variant | t r c tr trc |
| building | Verbundindex |
| bvnumber | BV045341709 |
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| contents | This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Key Features * Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers * Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology * Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations * Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications * Discusses the theory and design of near-field optical microscopes * Explains phase imaging in the scanning optical and interference microscopes |
| ctrlnum | (ZDB-4-ENC)ocn162129081 (OCoLC)162129081 (DE-599)BVBBV045341709 |
| dewey-full | 502/.8/2 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/2 |
| dewey-search | 502/.8/2 |
| dewey-sort | 3502 18 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
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| id | DE-604.BV045341709 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:15:25Z |
| institution | BVB |
| isbn | 9780124087507 0124087507 9780080529783 008052978X 1281046698 9781281046697 |
| language | English |
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| oclc_num | 162129081 |
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| physical | 1 online resource (xv, 335 pages) illustrations |
| psigel | ZDB-4-ENC |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Academic Press |
| record_format | marc |
| spelling | Corle, Timothy R. Verfasser aut Confocal scanning optical microscopy and related imaging systems Timothy R. Corle, Gordon S. Kino San Diego Academic Press 1996 1 online resource (xv, 335 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Print version record This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Key Features * Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers * Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology * Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations * Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications * Discusses the theory and design of near-field optical microscopes * Explains phase imaging in the scanning optical and interference microscopes SCIENCE / Microscopes & Microscopy bisacsh Confocal microscopy fast Imaging systems fast Confocal microscopy Imaging systems Rastermikroskopie (DE-588)4330329-8 gnd rswk-swf Konfokale Mikroskopie (DE-588)4336446-9 gnd rswk-swf Konfokale Mikroskopie (DE-588)4336446-9 s Rastermikroskopie (DE-588)4330329-8 s 1\p DE-604 Kino, Gordon S. Sonstige oth Erscheint auch als Druck-Ausgabe Corle, Timothy R. Confocal scanning optical microscopy and related imaging systems San Diego : Academic Press, 1996 0124087507 9780124087507 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Corle, Timothy R. Confocal scanning optical microscopy and related imaging systems This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Key Features * Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers * Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology * Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations * Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications * Discusses the theory and design of near-field optical microscopes * Explains phase imaging in the scanning optical and interference microscopes SCIENCE / Microscopes & Microscopy bisacsh Confocal microscopy fast Imaging systems fast Confocal microscopy Imaging systems Rastermikroskopie (DE-588)4330329-8 gnd Konfokale Mikroskopie (DE-588)4336446-9 gnd |
| subject_GND | (DE-588)4330329-8 (DE-588)4336446-9 |
| title | Confocal scanning optical microscopy and related imaging systems |
| title_auth | Confocal scanning optical microscopy and related imaging systems |
| title_exact_search | Confocal scanning optical microscopy and related imaging systems |
| title_full | Confocal scanning optical microscopy and related imaging systems Timothy R. Corle, Gordon S. Kino |
| title_fullStr | Confocal scanning optical microscopy and related imaging systems Timothy R. Corle, Gordon S. Kino |
| title_full_unstemmed | Confocal scanning optical microscopy and related imaging systems Timothy R. Corle, Gordon S. Kino |
| title_short | Confocal scanning optical microscopy and related imaging systems |
| title_sort | confocal scanning optical microscopy and related imaging systems |
| topic | SCIENCE / Microscopes & Microscopy bisacsh Confocal microscopy fast Imaging systems fast Confocal microscopy Imaging systems Rastermikroskopie (DE-588)4330329-8 gnd Konfokale Mikroskopie (DE-588)4336446-9 gnd |
| topic_facet | SCIENCE / Microscopes & Microscopy Confocal microscopy Imaging systems Confocal microscopy Imaging systems Rastermikroskopie Konfokale Mikroskopie |
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