Advanced nanoelectronics: post-silicon materials and devices
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Weinheim
Wiley-VCH
[2019]
|
| Subjects: | |
| Online Access: | http://www.wiley-vch.de/publish/dt/books/ISBN978-3-527-34358-4/ Inhaltsverzeichnis |
| Physical Description: | xii, 272 Seiten Illustrationen, Diagramme |
| ISBN: | 9783527343584 |
Staff View
MARC
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| 653 | |a Elektronische Materialien | ||
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| 653 | |a Komponenten u. Bauelemente | ||
| 653 | |a Materials Science | ||
| 653 | |a Materialwissenschaften | ||
| 653 | |a Physics | ||
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Record in the Search Index
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| adam_text | CONTENTS
PREFACE
XI
1 THE FUTURE OF CMOS: MORE MOORE OR A NEW DISRUPTIVE
TECHNOLOGY?
1
NAZEK EL-ATAB AND MUHAMMAD M. HUSSAIN
1.1 FINFET TECHNOLOGY 2
1.1.1 STATE-OF-THE-ART FINFETS 3
1.1.1.1 FINFET WITH SI CHANNEL 3
1.1.1.2 FINFET WITH HIGH-MOBILITY MATERIAL CHANNEL 4
1.1.13 FINFET WITH TMD CHANNEL 5
1.1.1.4 SOI VERSUS BULK FINFET 5
1.1.2 INDUSTRIAL STATE 6
1.1.3 CHALLENGES AND LIMITATIONS 7
1.2 3D INTEGRATED CIRCUIT TECHNOLOGY 8
1.2.1 RESEARCH STATE 9
1.2.1.1 THERMAL MANAGEMENT 9
1.2.1.2 THROUGH-SILICON-VIAS 9
1.2.1.3 BONDING IN 3D IC 10
1.2.1.4 TEST AND YIELD 12
1.2.2 INDUSTRIAL STATE 12
1.2.3 CHALLENGES AND LIMITATIONS 13
1.3 NEUROMORPHIC COMPUTING TECHNOLOGY 13
1.3.1 STATE-OF-THE-ART NONVOLATILE MEMORY AS A SYNAPSE 14
1.3.1.1 PHASE CHANGE MEMORY IS
1.3.1.2 CONDUCTIVE-BRIDGING RAM 16
1.3.1.3 FILAMENTARY RR AM 17
1.3.2 RESEARCH PROGRAMS AND INDUSTRIAL STATE OF NEUROMORPHIC
COMPUTING 18
1.4 QUANTUM COMPUTING TECHNOLOGY 19
1.4.1 QUANTUM BIT REQUIREMENT 20
1.4.2 RESEARCH STATE 20
1.4.2.1 SPIN-BASED QUBITS 20
1.4.3 SUPERCONDUCTING CIRCUITS FOR QUANTUM INFORMATION 21
1.4.4 INDUSTRY STATE 22
1.4.5 CHALLENGES AND LIMITATIONS TO QUANTUM COMPUTING 23
REFERENCES 23
2 NANOWIRE FIELD-EFFECT TRANSISTORS
33
DEBARGHYA SARKAR, IVAN S.
ESQUEDA, AND REHAN KAPADIA
2.1 GENERAL SCALING LAWS LEADING TO NANO WIRE ARCHITECTURES 33
2.1.1 SCALING OF PLANAR DEVICES AND OFF-STATE LEAKAGE CURRENT 33
2.1.2 FINFET AND UTB DEVICES FOR IMPROVED ELECTROSTATICS 35
2.1.3 NANO WIRES AS THE ULTIMATE LIMIT OF ELECTROSTATIC CONTROL 37
2.1.4 QUANTUM EFFECTS 39
2.1.5 DRIVE CURRENT 43
2.2 NANOWIRE GROWTH AND DEVICE FABRICATION APPROACHES 43
2.2.1 BOTTOM-UP VLS GROWTH 43
2.2.2 TOP-DOWN OXIDATION 45
2.3 STATE-OF-THE-ART NANOWIRE DEVICES 45
2.3.1 SILICON DEVICES 45
2.3.2 III-V DEVICES 46
REFERENCES 49
3 TWO-DIMENSIONAL MATERIALS FOR ELECTRONIC APPLICATIONS
55
HAIMENG ZHANG AND HAN WANG
3.1 2D MATERIALS TRANSISTOR AND DEVICE TECHNOLOGY 56
3.1.1 OPERATION AND CHARACTERISTICS OF 2D-MATERIALS-BASED FETS 57
3.1.2 AMBIPOLAR PROPERTY OF GRAPHENE 57
3.1.3 IMPORTANT FIGURES OF MERIT 58
3.1.3.1 /ON// OFF RATIO 58
3.1.3.2 SUBTHRESHOLD SWING 59
3.1.3.3 CUTOFF FREQUENCY AND MAXIMUM FREQUENCY OF OSCILLATION 59
3.1.3.4 MINIMUM NOISE FIGURE 60
3.1.4 DEVICE OPTIMIZATION 61
3.1.4.1 MOBILITY ENGINEERING 61
3.1.4.2 CURRENT SATURATION 62
3.1.4.3 METAL CONTACT 63
3.2 GRAPHENE ELECTRONICS FOR RADIOFREQUENCY APPLICATIONS 64
3.2.1 EXPERIMENTAL GRAPHENE RF TRANSISTORS 65
3.2.2 GRAPHENE-BASED INTEGRATED CIRCUITS 67
3.2.2.1 GRAPHENE AMBIPOLAR DEVICES 67
3.2.2.2 GRAPHENE OSCILLATORS
73
3.2.2.3 GRAPHENE RF RECEIVERS 73
3.2.2.4 GRAPHENE ELECTROMECHANICAL DEVICES: RESONATORS AND RF
SWITCHES 74
3.3 M
O
S2 DEVICES FOR DIGITAL APPLICATION 76
3.3.1 EXPERIMENTAL MOS2 TRANSISTORS 77
3.3.2 MOS2-BASED INTEGRATED CIRCUITS 78
3.3.2.1 DIRECT-COUPLED FET LOGIC CIRCUITS 78
3.3.2.2 LOGIC GATES 79
3.3.2.3 A STATIC RANDOM ACCESS MEMORY CELL BASED ON MOS2 82
3.3.2.4 RING OSCILLATORS BASED ON MOS2 82
3.3.2.5 MICROPROCESSORS BASED ON MOS2 85
REFERENCES 87
4 INTEGRATION OF GERMANIUM INTO MODERN CMOS: CHALLENGES
AND BREAKTHROUGHS
91
WONIL CHUNG, HENG WU, AND PEIDE D. YE
4.1 INTRODUCTION 91
4.2 JUNCTION FORMATION FOR GERMANIUM MOS DEVICES 92
4.2.1 CHARGE NEUTRALITY LEVEL AND FERMI LEVEL PINNING 92
4.2.2 METAL/GE CONTACTS 93
4.2.2.1 ALLEVIATION OF FLP 93
4.2.2.2 METAL/N-GE CONTACT 93
4.2.2.3 RECESSED CONTACT FORMATION 94
4.3 PROCESS INTEGRATION FOR GE MOS DEVICES 97
4.3.1 INTERFACE ENGINEERING ISSUES 97
4.3.2 VARIOUS GATE STACK COMBINATIONS FOR GE MOSFET 97
4.3.2.1 GEO#-FREE GATE STACK
WITH
ALD
HIGH-K
98
43.2.2 SILICON INTERFACIAL LAYER PASSIVATION 99
4.3.2.3 GERMANIUM (OXY)NITRIDATION 99
4.3.2.4 G E02-BASED GATE STACKS 99
4.3.2.5 RARE-EARTH OXIDES INTEGRATED INTO GERMANIUM MOSFETS 100
4.3.3 STRESS AND RELAXATION OF GE LAYER ON AN SI-BASED SUBSTRATE 102
4.4 STATE-OF-THE-ART GE CMOS WITH RECESSED CHANNEL AND S/D 102
4.4.1 GERMANIUM CMOS DEVICES 102
4.4.2 GERMANIUM CMOS CIRCUITS 105
4.5 STEEP-SLOPE DEVICE: NCFET 107
4.6 CONCLUSION 111
REFERENCES 112
5 CARBON NANOTUBE LOGIC TECHNOLOGY
119
JIANSHI TANG AND SHU-JEN HAN
5.1 INTRODUCTION - SILICON CMOS SCALING AND THE CHALLENGES 119
5.2 FUNDAMENTALS OF CARBON NANOTUBE 122
5.3 COMPLEMENTARY LOGIC AND DEVICE SCALABILITY DEMONSTRATIONS 124
5.3.1 CNT NFET AND CONTACT ENGINEERING FOR CMOS LOGIC 124
5.3.2 CHANNEL LENGTH SCALING IN CNTFET 127
5.3.3 CONTACT LENGTH SCALING IN CNTFET 132
5.4 PERSPECTIVE OF CNT-BASED LOGIC TECHNOLOGY 138
5.4.1 CVD-GROWN CNT VERSUS SOLUTION-PROCESSED CNT 138
5.4.2 PURITY AND PLACEMENT OF SOLUTION-PROCESSED CNTS 140
5.4.3 VARIABILITY IN CNTFETS 140
5.4.4 CIRCUIT-LEVEL INTEGRATION 142
5.5 SUMMARY AND OUTLOOK 142
REFERENCES 143
6 TUNNEL FIELD-EFFECT TRANSISTORS
151
DEBLINA SARKAR
6.1 INTRODUCTION 151
6.2 TUNNEL FIELD-EFFECT TRANSISTORS: THE FUNDAMENTALS 153
6.2.1 WORKING PRINCIPLE 153
6.2.2 SINGLE-CARRIER TUNNELING BARRIER AND SUBTHRESHOLD SWING 154
6.3 MODELING OF TFETS 156
6.4 DESIGN AND FABRICATION OF TFETS 161
6.4.1 DESIGN CONSIDERATIONS 161
6.4.2 CURRENT STATUS OF FABRICATED TFETS 162
6.5 BEYOND LOW-POWER COMPUTATION 166
6.5.1 ULTRASENSITIVE BIOSENSOR BASED ON TFET 169
6.5.2 IMPROVEMENT IN BIOSENSOR RESPONSE TIME 173
REFERENCES 175
7 ENERGY-EFFICIENT COMPUTING WITH NEGATIVE CAPACITANCE
179
ASIFL. KHAN
7.1 INTRODUCTION 179
7.2 HOW A NEGATIVE CAPACITANCE GATE OXIDE LEADS TO SUB-60-
MILLIVOLT/DECADE SWITCHING 181
7.3 HOW A FERROELECTRIC MATERIAL ACTS AS A NEGATIVE CAPACITOR 182
7.4 DIRECT MEASUREMENT OF NEGATIVE CAPACITANCE IN FERROELECTRIC 186
7.5 PROPERTIES OF NEGATIVE CAPACITANCE FETS: MODELING AND
SIMULATION 188
7.6 EXPERIMENTAL DEMONSTRATION OF NEGATIVE CAPACITANCE FETS 190
171 SPEED OF NEGATIVE CAPACITANCE TRANSISTORS 195
7.8 CONCLUSIONS 195
REFERENCES 196
8 SPIN-BASED DEVICES FOR LOGIC, MEMORY, AND NON-BOOLEAN
ARCHITECTURES
201
SUPRIYO BANDYOPADHYAY
8.1 INTRODUCTION 201
8.2 SPIN-BASED DEVICES 203
8.2.1 SPIN FIELD-EFFECT TRANSISTOR (SPINFET) 205
8.2.2 SINGLE SPIN LOGIC DEVICES AND CIRCUITS 209
8.3 NANOMAGNETIC DEVICES: A NANOMAGNET AS A GIANT CLASSICAL SPIN 212
8.3.1 READING MAGNETIZATION STATES (OR STORED BIT INFORMATION) IN
NANOMAGNETS 215
8.3.2 WRITING MAGNETIZATION STATES (OR STORING BIT INFORMATION) IN
NANOMAGNETS 216
8.3.2.1 SPIN-TRANSFER TORQUE 216
8.3.2.2 SPIN-TRANSFER TORQUE AIDED BY GIANT SPIN HALL EFFECT 217
8.3.2.3 VOLTAGE-CONTROLLED MAGNETIC ANISOTROPY 220
8.3.2.4 STRAINTRONICS 224
8.4 CONCLUSION 231
ACKNOWLEDGMENTS 232
REFERENCES 232
9 TERAHERTZ PROPERTIES AND APPLICATIONS OF GAN
237
BERARDI SENSOLE-RODRIGUEZ
9.1 INTRODUCTION 237
9.1.1 APPLICATIONS OF TERAHERTZ TECHNOLOGY 237
9.1.2 TERAHERTZ DEVICES AND CHALLENGES 239
9.2 GAN: PROPERTIES AND TRANSPORT MECHANISMS RELEVANT TO THZ
APPLICATIONS 242
9.2.1 MOBILITY AND INJECTION VELOCITY 242
9.2.2 DRIFT VELOCITY AND NEGATIVE DIFFERENTIAL RESISTANCE 245
9.2.3 TRANSPORT DUE TO ELECTRON PLASMA WAVES 246
9.3 GAN-BASED TERAHERTZ DEVICES: STATE OF THE ART 249
9.3.1 HIGH-ELECTRON MOBILITY TRANSISTORS 249
9.3.2 NDR AND RESONANT TUNNELING DEVICES 252
9.3.3 QUANTUM CASCADE LASERS 254
9.3.4 ELECTRON-PLASMA-WAVE-BASED DEVICES 254
REFERENCES 256
INDEX
265
|
| any_adam_object | 1 |
| author2 | Hussain, Muhammad Mustafa |
| author2_role | edt |
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| building | Verbundindex |
| bvnumber | BV045291536 |
| classification_rvk | ZN 3700 |
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| discipline | Chemie / Pharmazie Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| publisher | Wiley-VCH |
| record_format | marc |
| spellingShingle | Advanced nanoelectronics post-silicon materials and devices Elektronisches Bauelement (DE-588)4014360-0 gnd CMOS (DE-588)4010319-5 gnd Nanoelektronik (DE-588)4732034-5 gnd Werkstoff (DE-588)4065579-9 gnd |
| subject_GND | (DE-588)4014360-0 (DE-588)4010319-5 (DE-588)4732034-5 (DE-588)4065579-9 (DE-588)4143413-4 |
| title | Advanced nanoelectronics post-silicon materials and devices |
| title_auth | Advanced nanoelectronics post-silicon materials and devices |
| title_exact_search | Advanced nanoelectronics post-silicon materials and devices |
| title_full | Advanced nanoelectronics post-silicon materials and devices edited by Muhammad Mustafa Hussain |
| title_fullStr | Advanced nanoelectronics post-silicon materials and devices edited by Muhammad Mustafa Hussain |
| title_full_unstemmed | Advanced nanoelectronics post-silicon materials and devices edited by Muhammad Mustafa Hussain |
| title_short | Advanced nanoelectronics |
| title_sort | advanced nanoelectronics post silicon materials and devices |
| title_sub | post-silicon materials and devices |
| topic | Elektronisches Bauelement (DE-588)4014360-0 gnd CMOS (DE-588)4010319-5 gnd Nanoelektronik (DE-588)4732034-5 gnd Werkstoff (DE-588)4065579-9 gnd |
| topic_facet | Elektronisches Bauelement CMOS Nanoelektronik Werkstoff Aufsatzsammlung |
| url | http://www.wiley-vch.de/publish/dt/books/ISBN978-3-527-34358-4/ http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030678919&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT hussainmuhammadmustafa advancednanoelectronicspostsiliconmaterialsanddevices AT wileyvch advancednanoelectronicspostsiliconmaterialsanddevices |
Indexes
THWS Schweinfurt Zentralbibliothek Lesesaal
| Call Number: |
2000 ZN 3700 H972 |
|---|---|
| Copy 1 | ausleihbar Available Place a Hold |