Holdings: Post-Silicon Validation and Debug

Post-Silicon Validation and Debug:

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Bibliographic Details
Other Authors:	Mishra, Prabhat (Editor), Farahmandi, Farimah (Editor)
Format:	Electronic eBook
Language:	English
Published:	Cham Springer International Publishing 2019
Subjects:	Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation Systems engineering Computer science Electronics
Online Access:	BTU01 FAW01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBA01 UBY01 Volltext
Physical Description:	1 Online-Ressource (XV, 394 p. 189 illus., 113 illus. in color)
ISBN:	9783319981161
DOI:	10.1007/978-3-319-98116-1

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MARC


LEADER	00000nmm a2200000zc 4500
001	BV045240336
003	DE-604
005	00000000000000.0
007	cr\|uuu---uuuuu
008	181018s2019 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9783319981161 \|c Online \|9 978-3-319-98116-1
024	7		\|a 10.1007/978-3-319-98116-1 \|2 doi
035			\|a (ZDB-2-ENG)9783319981161
035			\|a (OCoLC)1057631766
035			\|a (DE-599)BVBBV045240336
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-384 \|a DE-860 \|a DE-91 \|a DE-1046 \|a DE-Aug4 \|a DE-898 \|a DE-861 \|a DE-523 \|a DE-859 \|a DE-863 \|a DE-862 \|a DE-92 \|a DE-573 \|a DE-M347 \|a DE-706 \|a DE-634
082	0		\|a 621.3815 \|2 23
084			\|a MAS 000 \|2 stub
084			\|a ELT 000 \|2 stub
245	1	0	\|a Post-Silicon Validation and Debug \|c edited by Prabhat Mishra, Farimah Farahmandi
264		1	\|a Cham \|b Springer International Publishing \|c 2019
300			\|a 1 Online-Ressource (XV, 394 p. 189 illus., 113 illus. in color)
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
650		4	\|a Circuits and Systems
650		4	\|a Processor Architectures
650		4	\|a Electronics and Microelectronics, Instrumentation
650		4	\|a Systems engineering
650		4	\|a Computer science
650		4	\|a Electronics
700	1		\|a Mishra, Prabhat \|4 edt
700	1		\|a Farahmandi, Farimah \|4 edt
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-319-98115-4
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-319-98117-8
856	4	0	\|u https://doi.org/10.1007/978-3-319-98116-1 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
912			\|a ZDB-2-ENG
940	1		\|q ZDB-2-ENG_2019_Fremddaten
999			\|a oai:aleph.bib-bvb.de:BVB01-030628566
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l BTU01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FAW01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FHA01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FHI01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FHM01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FHN01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FHR01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FKE01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FLA01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FRO01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FWS01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l FWS02 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l HTW01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l TUM01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l UBA01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-98116-1 \|l UBY01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext

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DE-BY-FWS_katkey	704937
_version_	1824554752184156160
any_adam_object
author2	Mishra, Prabhat Farahmandi, Farimah
author2_role	edt edt
author2_variant	p m pm f f ff
author_facet	Mishra, Prabhat Farahmandi, Farimah
building	Verbundindex
bvnumber	BV045240336
classification_tum	MAS 000 ELT 000
collection	ZDB-2-ENG
ctrlnum	(ZDB-2-ENG)9783319981161 (OCoLC)1057631766 (DE-599)BVBBV045240336
dewey-full	621.3815
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815
dewey-search	621.3815
dewey-sort	3621.3815
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau
doi_str_mv	10.1007/978-3-319-98116-1
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03199nmm a2200649zc 4500</leader><controlfield tag="001">BV045240336</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">181018s2019 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319981161</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-98116-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-98116-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783319981161</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1057631766</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045240336</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Post-Silicon Validation and Debug</subfield><subfield code="c">edited by Prabhat Mishra, Farimah Farahmandi</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2019</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XV, 394 p. 189 illus., 113 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Processor Architectures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer science</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mishra, Prabhat</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Farahmandi, Farimah</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-98115-4</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-98117-8</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2019_Fremddaten</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030628566</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FHM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">HTW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">UBA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-98116-1</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV045240336
illustrated	Not Illustrated
indexdate	2025-02-20T06:56:45Z
institution	BVB
isbn	9783319981161
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030628566
oclc_num	1057631766
open_access_boolean
owner	DE-384 DE-860 DE-91 DE-BY-TUM DE-1046 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634
owner_facet	DE-384 DE-860 DE-91 DE-BY-TUM DE-1046 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634
physical	1 Online-Ressource (XV, 394 p. 189 illus., 113 illus. in color)
psigel	ZDB-2-ENG ZDB-2-ENG_2019_Fremddaten
publishDate	2019
publishDateSearch	2019
publishDateSort	2019
publisher	Springer International Publishing
record_format	marc
spellingShingle	Post-Silicon Validation and Debug Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation Systems engineering Computer science Electronics
title	Post-Silicon Validation and Debug
title_auth	Post-Silicon Validation and Debug
title_exact_search	Post-Silicon Validation and Debug
title_full	Post-Silicon Validation and Debug edited by Prabhat Mishra, Farimah Farahmandi
title_fullStr	Post-Silicon Validation and Debug edited by Prabhat Mishra, Farimah Farahmandi
title_full_unstemmed	Post-Silicon Validation and Debug edited by Prabhat Mishra, Farimah Farahmandi
title_short	Post-Silicon Validation and Debug
title_sort	post silicon validation and debug
topic	Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation Systems engineering Computer science Electronics
topic_facet	Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation Systems engineering Computer science Electronics
url	https://doi.org/10.1007/978-3-319-98116-1
work_keys_str_mv	AT mishraprabhat postsiliconvalidationanddebug AT farahmandifarimah postsiliconvalidationanddebug

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