VLSI Design and Test for Systems Dependability:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer Japan
2019
|
| Schlagworte: | |
| Online-Zugang: | BTU01 FAW01 FHA01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBA01 UBY01 URL des Erstveröffentlichers |
| Beschreibung: | 1 Online-Ressource (XVII, 800 p. 585 illus., 352 illus. in color) |
| ISBN: | 9784431565949 |
| DOI: | 10.1007/978-4-431-56594-9 |
Internformat
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Datensatz im Suchindex
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| author2 | Asai, Shojiro |
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| author_facet | Asai, Shojiro |
| building | Verbundindex |
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| collection | ZDB-2-ENG |
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| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-4-431-56594-9 |
| format | Electronic eBook |
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| id | DE-604.BV045239472 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-01T13:41:08Z |
| institution | BVB |
| isbn | 9784431565949 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030627702 |
| oclc_num | 1057623865 |
| open_access_boolean | |
| owner | DE-384 DE-860 DE-91 DE-BY-TUM DE-1046 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
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| physical | 1 Online-Ressource (XVII, 800 p. 585 illus., 352 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2019_Fremddaten |
| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | Springer Japan |
| record_format | marc |
| spellingShingle | VLSI Design and Test for Systems Dependability Circuits and Systems Electronic Circuits and Devices Quality Control, Reliability, Safety and Risk Engineering Design Systems and Data Security Systems engineering System safety Engineering design Data protection |
| title | VLSI Design and Test for Systems Dependability |
| title_auth | VLSI Design and Test for Systems Dependability |
| title_exact_search | VLSI Design and Test for Systems Dependability |
| title_full | VLSI Design and Test for Systems Dependability edited by Shojiro Asai |
| title_fullStr | VLSI Design and Test for Systems Dependability edited by Shojiro Asai |
| title_full_unstemmed | VLSI Design and Test for Systems Dependability edited by Shojiro Asai |
| title_short | VLSI Design and Test for Systems Dependability |
| title_sort | vlsi design and test for systems dependability |
| topic | Circuits and Systems Electronic Circuits and Devices Quality Control, Reliability, Safety and Risk Engineering Design Systems and Data Security Systems engineering System safety Engineering design Data protection |
| topic_facet | Circuits and Systems Electronic Circuits and Devices Quality Control, Reliability, Safety and Risk Engineering Design Systems and Data Security Systems engineering System safety Engineering design Data protection |
| url | https://doi.org/10.1007/978-4-431-56594-9 |
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