Sequential Logic Testing and Verification:

In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care­ fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the in...

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Bibliographic Details
Main Authors: Ghosh, Abhijit (Author), Devadas, Srinivas (Author), Newton, A. Richard (Author)
Format: Electronic eBook
Language:English
Published: Boston, MA Springer US 1992
Series:The Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing 163
Subjects:
Online Access:BTU01
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Summary:In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care­ fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte­ gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance
Physical Description:1 Online-Ressource (XIX, 214 p)
ISBN:9781461536468
DOI:10.1007/978-1-4615-3646-8

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