Microelectronics Manufacturing Diagnostics Handbook:
The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining op...
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Weitere Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
1993
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Schlagworte: | |
Online-Zugang: | BTU01 URL des Erstveröffentlichers |
Zusammenfassung: | The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world |
Beschreibung: | 1 Online-Ressource (XXXIII, 633 p) |
ISBN: | 9781461520290 |
DOI: | 10.1007/978-1-4615-2029-0 |
Internformat
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520 | |a The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Manufacturing, Machines, Tools | |
650 | 4 | |a Control Structures and Microprogramming | |
650 | 4 | |a Engineering | |
650 | 4 | |a Microprogramming | |
650 | 4 | |a Manufacturing industries | |
650 | 4 | |a Machines | |
650 | 4 | |a Tools | |
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Datensatz im Suchindex
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any_adam_object | |
author2 | Landzberg, Abraham H. |
author2_role | edt |
author2_variant | a h l ah ahl |
author_facet | Landzberg, Abraham H. |
building | Verbundindex |
bvnumber | BV045187376 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)978-1-4615-2029-0 (OCoLC)1053837045 (DE-599)BVBBV045187376 |
dewey-full | 670 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 670 - Manufacturing |
dewey-raw | 670 |
dewey-search | 670 |
dewey-sort | 3670 |
dewey-tens | 670 - Manufacturing |
discipline | Werkstoffwissenschaften / Fertigungstechnik |
doi_str_mv | 10.1007/978-1-4615-2029-0 |
format | Electronic eBook |
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id | DE-604.BV045187376 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:10:59Z |
institution | BVB |
isbn | 9781461520290 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030576554 |
oclc_num | 1053837045 |
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physical | 1 Online-Ressource (XXXIII, 633 p) |
psigel | ZDB-2-ENG ZDB-2-ENG_Archiv ZDB-2-ENG ZDB-2-ENG_Archiv |
publishDate | 1993 |
publishDateSearch | 1993 |
publishDateSort | 1993 |
publisher | Springer US |
record_format | marc |
spelling | Microelectronics Manufacturing Diagnostics Handbook edited by Abraham H. Landzberg Boston, MA Springer US 1993 1 Online-Ressource (XXXIII, 633 p) txt rdacontent c rdamedia cr rdacarrier The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world Engineering Manufacturing, Machines, Tools Control Structures and Microprogramming Microprogramming Manufacturing industries Machines Tools Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 s 1\p DE-604 Landzberg, Abraham H. edt Erscheint auch als Druck-Ausgabe 9781461358404 https://doi.org/10.1007/978-1-4615-2029-0 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Microelectronics Manufacturing Diagnostics Handbook Engineering Manufacturing, Machines, Tools Control Structures and Microprogramming Microprogramming Manufacturing industries Machines Tools Mikroelektronik (DE-588)4039207-7 gnd |
subject_GND | (DE-588)4039207-7 |
title | Microelectronics Manufacturing Diagnostics Handbook |
title_auth | Microelectronics Manufacturing Diagnostics Handbook |
title_exact_search | Microelectronics Manufacturing Diagnostics Handbook |
title_full | Microelectronics Manufacturing Diagnostics Handbook edited by Abraham H. Landzberg |
title_fullStr | Microelectronics Manufacturing Diagnostics Handbook edited by Abraham H. Landzberg |
title_full_unstemmed | Microelectronics Manufacturing Diagnostics Handbook edited by Abraham H. Landzberg |
title_short | Microelectronics Manufacturing Diagnostics Handbook |
title_sort | microelectronics manufacturing diagnostics handbook |
topic | Engineering Manufacturing, Machines, Tools Control Structures and Microprogramming Microprogramming Manufacturing industries Machines Tools Mikroelektronik (DE-588)4039207-7 gnd |
topic_facet | Engineering Manufacturing, Machines, Tools Control Structures and Microprogramming Microprogramming Manufacturing industries Machines Tools Mikroelektronik |
url | https://doi.org/10.1007/978-1-4615-2029-0 |
work_keys_str_mv | AT landzbergabrahamh microelectronicsmanufacturingdiagnosticshandbook |