APA (7th ed.) Citation

Krstić, A., & Cheng, K. (1998). Delay Fault Testing for VLSI Circuits. Springer US. https://doi.org/10.1007/978-1-4615-5597-1

Chicago Style (17th ed.) Citation

Krstić, Angela, and Kwang-Ting Cheng. Delay Fault Testing for VLSI Circuits. Boston, MA: Springer US, 1998. https://doi.org/10.1007/978-1-4615-5597-1.

MLA (9th ed.) Citation

Krstić, Angela, and Kwang-Ting Cheng. Delay Fault Testing for VLSI Circuits. Springer US, 1998. https://doi.org/10.1007/978-1-4615-5597-1.