Third Caltech Conference on Very Large Scale Integration:
The papers in this book were presented at the Third Caltech Conference on Very Large Scale Integration, held March 21-23, 1983 in Pasadena, California. The conference was organized by the Computer Science Depart ment, California Institute of Technology, and was partly supported by the Caltech Silic...
Gespeichert in:
Weitere Verfasser: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1983
|
Schlagworte: | |
Online-Zugang: | BTU01 Volltext |
Zusammenfassung: | The papers in this book were presented at the Third Caltech Conference on Very Large Scale Integration, held March 21-23, 1983 in Pasadena, California. The conference was organized by the Computer Science Depart ment, California Institute of Technology, and was partly supported by the Caltech Silicon Structures Project. This conference focused on the role of systematic methodologies, theoretical models, and algorithms in all phases of the design, verification, and testing of very large scale integrated circuits. The need for such disciplines has arisen as a result of the rapid progress of integrated circuit technology over the past 10 years. This progress has been driven largely by the fabrica tion technology, providing the capability to manufacture very complex elec tronic systems reliably and at low cost. At this point the capability to manufac ture very large scale integrated circuits has exceeded our capability to develop new product designs quickly, reliably, and at a reasonable cost. As a result new designs are undertaken only if the production volume will be large enough to amortize high design costs, products first appear on the market well past their announced delivery date, and reference manuals must be amended to document design flaws. Recent research in universities and in private industry has created an emerg ing science of very large scale integration |
Beschreibung: | 1 Online-Ressource (XIII, 430 p) |
ISBN: | 9783642954320 |
DOI: | 10.1007/978-3-642-95432-0 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV045185561 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 180912s1983 |||| o||u| ||||||eng d | ||
020 | |a 9783642954320 |9 978-3-642-95432-0 | ||
024 | 7 | |a 10.1007/978-3-642-95432-0 |2 doi | |
035 | |a (ZDB-2-ENG)978-3-642-95432-0 | ||
035 | |a (OCoLC)1053796646 | ||
035 | |a (DE-599)BVBBV045185561 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-634 | ||
082 | 0 | |a 621.381 |2 23 | |
084 | |a SD 1983 |0 (DE-625)142717: |2 rvk | ||
245 | 1 | 0 | |a Third Caltech Conference on Very Large Scale Integration |c edited by Randal Bryant |
264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1983 | |
300 | |a 1 Online-Ressource (XIII, 430 p) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
520 | |a The papers in this book were presented at the Third Caltech Conference on Very Large Scale Integration, held March 21-23, 1983 in Pasadena, California. The conference was organized by the Computer Science Depart ment, California Institute of Technology, and was partly supported by the Caltech Silicon Structures Project. This conference focused on the role of systematic methodologies, theoretical models, and algorithms in all phases of the design, verification, and testing of very large scale integrated circuits. The need for such disciplines has arisen as a result of the rapid progress of integrated circuit technology over the past 10 years. This progress has been driven largely by the fabrica tion technology, providing the capability to manufacture very complex elec tronic systems reliably and at low cost. At this point the capability to manufac ture very large scale integrated circuits has exceeded our capability to develop new product designs quickly, reliably, and at a reasonable cost. As a result new designs are undertaken only if the production volume will be large enough to amortize high design costs, products first appear on the market well past their announced delivery date, and reference manuals must be amended to document design flaws. Recent research in universities and in private industry has created an emerg ing science of very large scale integration | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
650 | 4 | |a Engineering | |
650 | 4 | |a Electronics | |
650 | 4 | |a Microelectronics | |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a LSI |0 (DE-588)4168200-2 |2 gnd |9 rswk-swf |
655 | 7 | |8 1\p |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z Pasadena Calif. |2 gnd-content | |
689 | 0 | 0 | |a LSI |0 (DE-588)4168200-2 |D s |
689 | 0 | 1 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | |8 2\p |5 DE-604 | |
689 | 1 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
689 | 1 | |8 3\p |5 DE-604 | |
700 | 1 | |a Bryant, Randal |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9783540123699 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-3-642-95432-0 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_Archiv | |
999 | |a oai:aleph.bib-bvb.de:BVB01-030574738 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
966 | e | |u https://doi.org/10.1007/978-3-642-95432-0 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804178875607941120 |
---|---|
any_adam_object | |
author2 | Bryant, Randal |
author2_role | edt |
author2_variant | r b rb |
author_facet | Bryant, Randal |
building | Verbundindex |
bvnumber | BV045185561 |
classification_rvk | SD 1983 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)978-3-642-95432-0 (OCoLC)1053796646 (DE-599)BVBBV045185561 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Mathematik Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-3-642-95432-0 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03613nmm a2200577zc 4500</leader><controlfield tag="001">BV045185561</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180912s1983 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783642954320</subfield><subfield code="9">978-3-642-95432-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-642-95432-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-3-642-95432-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1053796646</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045185561</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">SD 1983</subfield><subfield code="0">(DE-625)142717:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Third Caltech Conference on Very Large Scale Integration</subfield><subfield code="c">edited by Randal Bryant</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1983</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIII, 430 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The papers in this book were presented at the Third Caltech Conference on Very Large Scale Integration, held March 21-23, 1983 in Pasadena, California. The conference was organized by the Computer Science Depart ment, California Institute of Technology, and was partly supported by the Caltech Silicon Structures Project. This conference focused on the role of systematic methodologies, theoretical models, and algorithms in all phases of the design, verification, and testing of very large scale integrated circuits. The need for such disciplines has arisen as a result of the rapid progress of integrated circuit technology over the past 10 years. This progress has been driven largely by the fabrica tion technology, providing the capability to manufacture very complex elec tronic systems reliably and at low cost. At this point the capability to manufac ture very large scale integrated circuits has exceeded our capability to develop new product designs quickly, reliably, and at a reasonable cost. As a result new designs are undertaken only if the production volume will be large enough to amortize high design costs, products first appear on the market well past their announced delivery date, and reference manuals must be amended to document design flaws. Recent research in universities and in private industry has created an emerg ing science of very large scale integration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">LSI</subfield><subfield code="0">(DE-588)4168200-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">Pasadena Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">LSI</subfield><subfield code="0">(DE-588)4168200-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bryant, Randal</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9783540123699</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-642-95432-0</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_Archiv</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030574738</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-642-95432-0</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
genre | 1\p (DE-588)1071861417 Konferenzschrift 1983 Pasadena Calif. gnd-content |
genre_facet | Konferenzschrift 1983 Pasadena Calif. |
id | DE-604.BV045185561 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:10:55Z |
institution | BVB |
isbn | 9783642954320 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030574738 |
oclc_num | 1053796646 |
open_access_boolean | |
owner | DE-634 |
owner_facet | DE-634 |
physical | 1 Online-Ressource (XIII, 430 p) |
psigel | ZDB-2-ENG ZDB-2-ENG_Archiv ZDB-2-ENG ZDB-2-ENG_Archiv |
publishDate | 1983 |
publishDateSearch | 1983 |
publishDateSort | 1983 |
publisher | Springer Berlin Heidelberg |
record_format | marc |
spelling | Third Caltech Conference on Very Large Scale Integration edited by Randal Bryant Berlin, Heidelberg Springer Berlin Heidelberg 1983 1 Online-Ressource (XIII, 430 p) txt rdacontent c rdamedia cr rdacarrier The papers in this book were presented at the Third Caltech Conference on Very Large Scale Integration, held March 21-23, 1983 in Pasadena, California. The conference was organized by the Computer Science Depart ment, California Institute of Technology, and was partly supported by the Caltech Silicon Structures Project. This conference focused on the role of systematic methodologies, theoretical models, and algorithms in all phases of the design, verification, and testing of very large scale integrated circuits. The need for such disciplines has arisen as a result of the rapid progress of integrated circuit technology over the past 10 years. This progress has been driven largely by the fabrica tion technology, providing the capability to manufacture very complex elec tronic systems reliably and at low cost. At this point the capability to manufac ture very large scale integrated circuits has exceeded our capability to develop new product designs quickly, reliably, and at a reasonable cost. As a result new designs are undertaken only if the production volume will be large enough to amortize high design costs, products first appear on the market well past their announced delivery date, and reference manuals must be amended to document design flaws. Recent research in universities and in private industry has created an emerg ing science of very large scale integration Engineering Electronics and Microelectronics, Instrumentation Electronics Microelectronics Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf LSI (DE-588)4168200-2 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift 1983 Pasadena Calif. gnd-content LSI (DE-588)4168200-2 s Integrierte Schaltung (DE-588)4027242-4 s 2\p DE-604 VLSI (DE-588)4117388-0 s 3\p DE-604 Bryant, Randal edt Erscheint auch als Druck-Ausgabe 9783540123699 https://doi.org/10.1007/978-3-642-95432-0 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Third Caltech Conference on Very Large Scale Integration Engineering Electronics and Microelectronics, Instrumentation Electronics Microelectronics Integrierte Schaltung (DE-588)4027242-4 gnd VLSI (DE-588)4117388-0 gnd LSI (DE-588)4168200-2 gnd |
subject_GND | (DE-588)4027242-4 (DE-588)4117388-0 (DE-588)4168200-2 (DE-588)1071861417 |
title | Third Caltech Conference on Very Large Scale Integration |
title_auth | Third Caltech Conference on Very Large Scale Integration |
title_exact_search | Third Caltech Conference on Very Large Scale Integration |
title_full | Third Caltech Conference on Very Large Scale Integration edited by Randal Bryant |
title_fullStr | Third Caltech Conference on Very Large Scale Integration edited by Randal Bryant |
title_full_unstemmed | Third Caltech Conference on Very Large Scale Integration edited by Randal Bryant |
title_short | Third Caltech Conference on Very Large Scale Integration |
title_sort | third caltech conference on very large scale integration |
topic | Engineering Electronics and Microelectronics, Instrumentation Electronics Microelectronics Integrierte Schaltung (DE-588)4027242-4 gnd VLSI (DE-588)4117388-0 gnd LSI (DE-588)4168200-2 gnd |
topic_facet | Engineering Electronics and Microelectronics, Instrumentation Electronics Microelectronics Integrierte Schaltung VLSI LSI Konferenzschrift 1983 Pasadena Calif. |
url | https://doi.org/10.1007/978-3-642-95432-0 |
work_keys_str_mv | AT bryantrandal thirdcaltechconferenceonverylargescaleintegration |