Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1992
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| Ausgabe: | 2 |
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Zusammenfassung: | In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities |
| Beschreibung: | 1 Online-Ressource (840 p) |
| ISBN: | 9781461304913 |
| DOI: | 10.1007/978-1-4613-0491-3 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045178569 | ||
| 003 | DE-604 | ||
| 005 | 20190821 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180911s1992 |||| o||u| ||||||eng d | ||
| 020 | |a 9781461304913 |9 978-1-4613-0491-3 | ||
| 024 | 7 | |a 10.1007/978-1-4613-0491-3 |2 doi | |
| 035 | |a (ZDB-2-EES)978-1-4613-0491-3 | ||
| 035 | |a (OCoLC)1053829320 | ||
| 035 | |a (DE-599)BVBBV045178569 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-634 | ||
| 082 | 0 | |a 550 |2 23 | |
| 100 | 1 | |a Goldstein, Joseph |d 1939-2015 |e Verfasser |0 (DE-588)1023852381 |4 aut | |
| 245 | 1 | 0 | |a Scanning Electron Microscopy and X-Ray Microanalysis |b A Text for Biologists, Materials Scientists, and Geologists |c by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, Eric Lifshin |
| 250 | |a 2 | ||
| 264 | 1 | |a Boston, MA |b Springer US |c 1992 | |
| 300 | |a 1 Online-Ressource (840 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 520 | |a In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities | ||
| 650 | 4 | |a Earth Sciences | |
| 650 | 4 | |a Earth Sciences, general | |
| 650 | 4 | |a Developmental Biology | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Earth sciences | |
| 650 | 4 | |a Developmental biology | |
| 650 | 4 | |a Materials science | |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | 1 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 1 | 1 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 689 | 2 | 0 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
| 689 | 2 | 1 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 2 | |8 3\p |5 DE-604 | |
| 689 | 3 | 0 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |D s |
| 689 | 3 | |8 4\p |5 DE-604 | |
| 700 | 1 | |a Newbury, Dale E. |4 aut | |
| 700 | 1 | |a Echlin, Patrick |4 aut | |
| 700 | 1 | |a Joy, David C. |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781461276531 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4613-0491-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-EES | ||
| 940 | 1 | |q ZDB-2-EES_Archiv | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030567798 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://doi.org/10.1007/978-1-4613-0491-3 |l BTU01 |p ZDB-2-EES |q ZDB-2-EES_Archiv |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804178868991426560 |
|---|---|
| any_adam_object | |
| author | Goldstein, Joseph 1939-2015 Newbury, Dale E. Echlin, Patrick Joy, David C. |
| author_GND | (DE-588)1023852381 |
| author_facet | Goldstein, Joseph 1939-2015 Newbury, Dale E. Echlin, Patrick Joy, David C. |
| author_role | aut aut aut aut |
| author_sort | Goldstein, Joseph 1939-2015 |
| author_variant | j g jg d e n de den p e pe d c j dc dcj |
| building | Verbundindex |
| bvnumber | BV045178569 |
| collection | ZDB-2-EES |
| ctrlnum | (ZDB-2-EES)978-1-4613-0491-3 (OCoLC)1053829320 (DE-599)BVBBV045178569 |
| dewey-full | 550 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 550 - Earth sciences |
| dewey-raw | 550 |
| dewey-search | 550 |
| dewey-sort | 3550 |
| dewey-tens | 550 - Earth sciences |
| discipline | Geologie / Paläontologie |
| doi_str_mv | 10.1007/978-1-4613-0491-3 |
| edition | 2 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04544nmm a2200733zc 4500</leader><controlfield tag="001">BV045178569</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20190821 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180911s1992 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781461304913</subfield><subfield code="9">978-1-4613-0491-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4613-0491-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-EES)978-1-4613-0491-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1053829320</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045178569</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">550</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Goldstein, Joseph</subfield><subfield code="d">1939-2015</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1023852381</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning Electron Microscopy and X-Ray Microanalysis</subfield><subfield code="b">A Text for Biologists, Materials Scientists, and Geologists</subfield><subfield code="c">by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, Eric Lifshin</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (840 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Earth Sciences</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Earth Sciences, general</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Developmental Biology</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Earth sciences</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Developmental biology</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Raster-Transmissions-Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4320991-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Raster-Transmissions-Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4320991-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Newbury, Dale E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Echlin, Patrick</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Joy, David C.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781461276531</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4613-0491-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-EES</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-EES_Archiv</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030567798</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4613-0491-3</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-EES</subfield><subfield code="q">ZDB-2-EES_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045178569 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:49Z |
| institution | BVB |
| isbn | 9781461304913 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030567798 |
| oclc_num | 1053829320 |
| open_access_boolean | |
| owner | DE-634 |
| owner_facet | DE-634 |
| physical | 1 Online-Ressource (840 p) |
| psigel | ZDB-2-EES ZDB-2-EES_Archiv ZDB-2-EES ZDB-2-EES_Archiv |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Springer US |
| record_format | marc |
| spelling | Goldstein, Joseph 1939-2015 Verfasser (DE-588)1023852381 aut Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, Eric Lifshin 2 Boston, MA Springer US 1992 1 Online-Ressource (840 p) txt rdacontent c rdamedia cr rdacarrier In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities Earth Sciences Earth Sciences, general Developmental Biology Characterization and Evaluation of Materials Earth sciences Developmental biology Materials science Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s Röntgenstrukturanalyse (DE-588)4137203-7 s 1\p DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s 2\p DE-604 3\p DE-604 Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 4\p DE-604 Newbury, Dale E. aut Echlin, Patrick aut Joy, David C. aut Erscheint auch als Druck-Ausgabe 9781461276531 https://doi.org/10.1007/978-1-4613-0491-3 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goldstein, Joseph 1939-2015 Newbury, Dale E. Echlin, Patrick Joy, David C. Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists Earth Sciences Earth Sciences, general Developmental Biology Characterization and Evaluation of Materials Earth sciences Developmental biology Materials science Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Werkstoff (DE-588)4065579-9 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| subject_GND | (DE-588)4048455-5 (DE-588)4320991-9 (DE-588)4065579-9 (DE-588)4137203-7 (DE-588)4151898-6 |
| title | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists |
| title_auth | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists |
| title_exact_search | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists |
| title_full | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, Eric Lifshin |
| title_fullStr | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, Eric Lifshin |
| title_full_unstemmed | Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists, and Geologists by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, Eric Lifshin |
| title_short | Scanning Electron Microscopy and X-Ray Microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis a text for biologists materials scientists and geologists |
| title_sub | A Text for Biologists, Materials Scientists, and Geologists |
| topic | Earth Sciences Earth Sciences, general Developmental Biology Characterization and Evaluation of Materials Earth sciences Developmental biology Materials science Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Werkstoff (DE-588)4065579-9 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Earth Sciences Earth Sciences, general Developmental Biology Characterization and Evaluation of Materials Earth sciences Developmental biology Materials science Rasterelektronenmikroskopie Raster-Transmissions-Elektronenmikroskopie Werkstoff Röntgenstrukturanalyse Elektronenstrahlmikroanalyse |
| url | https://doi.org/10.1007/978-1-4613-0491-3 |
| work_keys_str_mv | AT goldsteinjoseph scanningelectronmicroscopyandxraymicroanalysisatextforbiologistsmaterialsscientistsandgeologists AT newburydalee scanningelectronmicroscopyandxraymicroanalysisatextforbiologistsmaterialsscientistsandgeologists AT echlinpatrick scanningelectronmicroscopyandxraymicroanalysisatextforbiologistsmaterialsscientistsandgeologists AT joydavidc scanningelectronmicroscopyandxraymicroanalysisatextforbiologistsmaterialsscientistsandgeologists |