APA (7th ed.) Citation

Bley, D. C., Droppo, J. G., Eremenko, V. A., & Lundgren, R. (2003). Risk Methodologies for Technological Legacies. Springer Netherlands. https://doi.org/10.1007/978-94-010-0097-0

Chicago Style (17th ed.) Citation

Bley, Dennis C., James G. Droppo, Vitaly A. Eremenko, and Regina Lundgren. Risk Methodologies for Technological Legacies. Dordrecht: Springer Netherlands, 2003. https://doi.org/10.1007/978-94-010-0097-0.

MLA (9th ed.) Citation

Bley, Dennis C., et al. Risk Methodologies for Technological Legacies. Springer Netherlands, 2003. https://doi.org/10.1007/978-94-010-0097-0.