Defects in SiO2 and Related Dielectrics: Science and Technology:
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the man...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Dordrecht
Springer Netherlands
2000
|
| Schriftenreihe: | NATO Science Series, Series II: Mathematical and Physical Chemistry
2 |
| Schlagworte: | |
| Online-Zugang: | UBT01 URL des Erstveröffentlichers |
| Zusammenfassung: | Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy |
| Beschreibung: | 1 Online-Ressource (VIII, 624 p. 87 illus) |
| ISBN: | 9789401009447 |
| DOI: | 10.1007/978-94-010-0944-7 |
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| isbn | 9789401009447 |
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| spelling | Defects in SiO2 and Related Dielectrics: Science and Technology edited by G. Pacchioni, L. Skuja, D. L. Griscom Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 Dordrecht Springer Netherlands 2000 1 Online-Ressource (VIII, 624 p. 87 illus) txt rdacontent c rdamedia cr rdacarrier NATO Science Series, Series II: Mathematical and Physical Chemistry 2 Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy Materials Science Characterization and Evaluation of Materials Condensed Matter Physics Materials science Condensed matter Pacchioni, G. edt Skuja, L. edt Griscom, D. L. edt Erscheint auch als Druck-Ausgabe 9780792366867 https://doi.org/10.1007/978-94-010-0944-7 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Defects in SiO2 and Related Dielectrics: Science and Technology Materials Science Characterization and Evaluation of Materials Condensed Matter Physics Materials science Condensed matter |
| title | Defects in SiO2 and Related Dielectrics: Science and Technology |
| title_alt | Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 |
| title_auth | Defects in SiO2 and Related Dielectrics: Science and Technology |
| title_exact_search | Defects in SiO2 and Related Dielectrics: Science and Technology |
| title_full | Defects in SiO2 and Related Dielectrics: Science and Technology edited by G. Pacchioni, L. Skuja, D. L. Griscom |
| title_fullStr | Defects in SiO2 and Related Dielectrics: Science and Technology edited by G. Pacchioni, L. Skuja, D. L. Griscom |
| title_full_unstemmed | Defects in SiO2 and Related Dielectrics: Science and Technology edited by G. Pacchioni, L. Skuja, D. L. Griscom |
| title_short | Defects in SiO2 and Related Dielectrics: Science and Technology |
| title_sort | defects in sio2 and related dielectrics science and technology |
| topic | Materials Science Characterization and Evaluation of Materials Condensed Matter Physics Materials science Condensed matter |
| topic_facet | Materials Science Characterization and Evaluation of Materials Condensed Matter Physics Materials science Condensed matter |
| url | https://doi.org/10.1007/978-94-010-0944-7 |
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