APA (7th ed.) Citation

Pacchioni, G., Skuja, L., & Griscom, D. L. (2000). Defects in SiO2 and Related Dielectrics: Science and Technology. Springer Netherlands. https://doi.org/10.1007/978-94-010-0944-7

Chicago Style (17th ed.) Citation

Pacchioni, G., L. Skuja, and D. L. Griscom. Defects in SiO2 and Related Dielectrics: Science and Technology. Dordrecht: Springer Netherlands, 2000. https://doi.org/10.1007/978-94-010-0944-7.

MLA (9th ed.) Citation

Pacchioni, G., et al. Defects in SiO2 and Related Dielectrics: Science and Technology. Springer Netherlands, 2000. https://doi.org/10.1007/978-94-010-0944-7.