Advances in Scanning Probe Microscopy:
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future si...
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2000
|
| Schriftenreihe: | Advances in Materials Research
2 |
| Schlagworte: | |
| Online-Zugang: | UBT01 Volltext |
| Zusammenfassung: | This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices |
| Beschreibung: | 1 Online-Ressource (XIV, 343 p) |
| ISBN: | 9783642569494 |
| DOI: | 10.1007/978-3-642-56949-4 |
Internformat
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Datensatz im Suchindex
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-642-56949-4 |
| format | Electronic eBook |
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| id | DE-604.BV045152072 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:07Z |
| institution | BVB |
| isbn | 9783642569494 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030541740 |
| oclc_num | 1050940137 |
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| physical | 1 Online-Ressource (XIV, 343 p) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2000/2004 ZDB-2-CMS ZDB-2-CMS_2000/2004 |
| publishDate | 2000 |
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| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series2 | Advances in Materials Research |
| spelling | Advances in Scanning Probe Microscopy edited by Toshio Sakurai, Yousuke Watanabe Berlin, Heidelberg Springer Berlin Heidelberg 2000 1 Online-Ressource (XIV, 343 p) txt rdacontent c rdamedia cr rdacarrier Advances in Materials Research 2 This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices Engineering Electronics and Microelectronics, Instrumentation Science, general Materials Science, general Surfaces and Interfaces, Thin Films Optical and Electronic Materials Solid State Physics Science Solid state physics Electronics Microelectronics Materials science Optical materials Electronic materials Materials / Surfaces Thin films Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s 1\p DE-604 Sakurai, Toshio edt Watanabe, Yousuke edt Erscheint auch als Druck-Ausgabe 9783642630842 https://doi.org/10.1007/978-3-642-56949-4 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Advances in Scanning Probe Microscopy Engineering Electronics and Microelectronics, Instrumentation Science, general Materials Science, general Surfaces and Interfaces, Thin Films Optical and Electronic Materials Solid State Physics Science Solid state physics Electronics Microelectronics Materials science Optical materials Electronic materials Materials / Surfaces Thin films Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Advances in Scanning Probe Microscopy |
| title_auth | Advances in Scanning Probe Microscopy |
| title_exact_search | Advances in Scanning Probe Microscopy |
| title_full | Advances in Scanning Probe Microscopy edited by Toshio Sakurai, Yousuke Watanabe |
| title_fullStr | Advances in Scanning Probe Microscopy edited by Toshio Sakurai, Yousuke Watanabe |
| title_full_unstemmed | Advances in Scanning Probe Microscopy edited by Toshio Sakurai, Yousuke Watanabe |
| title_short | Advances in Scanning Probe Microscopy |
| title_sort | advances in scanning probe microscopy |
| topic | Engineering Electronics and Microelectronics, Instrumentation Science, general Materials Science, general Surfaces and Interfaces, Thin Films Optical and Electronic Materials Solid State Physics Science Solid state physics Electronics Microelectronics Materials science Optical materials Electronic materials Materials / Surfaces Thin films Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Engineering Electronics and Microelectronics, Instrumentation Science, general Materials Science, general Surfaces and Interfaces, Thin Films Optical and Electronic Materials Solid State Physics Science Solid state physics Electronics Microelectronics Materials science Optical materials Electronic materials Materials / Surfaces Thin films Rastersondenmikroskopie |
| url | https://doi.org/10.1007/978-3-642-56949-4 |
| work_keys_str_mv | AT sakuraitoshio advancesinscanningprobemicroscopy AT watanabeyousuke advancesinscanningprobemicroscopy |