Electron Backscatter Diffraction in Materials Science:
Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
2000
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Schlagworte: | |
Online-Zugang: | UBT01 URL des Erstveröffentlichers |
Zusammenfassung: | Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique |
Beschreibung: | 1 Online-Ressource (XVI, 339 p. 550 illus., 197 illus. in color) |
ISBN: | 9781475732054 |
DOI: | 10.1007/978-1-4757-3205-4 |
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520 | |a Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique | ||
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Datensatz im Suchindex
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indexdate | 2024-07-10T08:10:07Z |
institution | BVB |
isbn | 9781475732054 |
language | English |
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physical | 1 Online-Ressource (XVI, 339 p. 550 illus., 197 illus. in color) |
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publisher | Springer US |
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spelling | Electron Backscatter Diffraction in Materials Science edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams Boston, MA Springer US 2000 1 Online-Ressource (XVI, 339 p. 550 illus., 197 illus. in color) txt rdacontent c rdamedia cr rdacarrier Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystalline materials. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories within the past decade due to the wide availability of SEMs, the ease of sample preparation from the bulk, the high speed of data acquisition, and the access to complimentary information about the microstructure on a submicron scale. This entirely new second edition describes the complete EBSD technique, from the experimental set-up, representations of textures, and dynamical simulation, to energy-filtered, spherical, and 3-D EBSD, to phase identification, in situ experiments, strain mapping, and grain boundary networks, to the design and modeling of materials microstructures. Numerous application examples including the analysis of deformation microstructure, dynamic deformation and damage, and EBSD studies in the earth sciences provide details of this powerful materials characterization technique Materials Science Characterization and Evaluation of Materials Animal Anatomy / Morphology / Histology Geochemistry Physical Chemistry Biochemistry, general Materials science Physical chemistry Biochemistry Animal anatomy Kristallographie (DE-588)4033217-2 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Rückstreuung (DE-588)4178653-1 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 s Kristallographie (DE-588)4033217-2 s Elektronenbeugung (DE-588)4151862-7 s Rückstreuung (DE-588)4178653-1 s 1\p DE-604 Schwartz, Adam J. edt Kumar, Mukul edt Adams, Brent L. edt Erscheint auch als Druck-Ausgabe 9781475732078 https://doi.org/10.1007/978-1-4757-3205-4 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Electron Backscatter Diffraction in Materials Science Materials Science Characterization and Evaluation of Materials Animal Anatomy / Morphology / Histology Geochemistry Physical Chemistry Biochemistry, general Materials science Physical chemistry Biochemistry Animal anatomy Kristallographie (DE-588)4033217-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd Rückstreuung (DE-588)4178653-1 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
subject_GND | (DE-588)4033217-2 (DE-588)4151862-7 (DE-588)4178653-1 (DE-588)4079184-1 |
title | Electron Backscatter Diffraction in Materials Science |
title_auth | Electron Backscatter Diffraction in Materials Science |
title_exact_search | Electron Backscatter Diffraction in Materials Science |
title_full | Electron Backscatter Diffraction in Materials Science edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams |
title_fullStr | Electron Backscatter Diffraction in Materials Science edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams |
title_full_unstemmed | Electron Backscatter Diffraction in Materials Science edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams |
title_short | Electron Backscatter Diffraction in Materials Science |
title_sort | electron backscatter diffraction in materials science |
topic | Materials Science Characterization and Evaluation of Materials Animal Anatomy / Morphology / Histology Geochemistry Physical Chemistry Biochemistry, general Materials science Physical chemistry Biochemistry Animal anatomy Kristallographie (DE-588)4033217-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd Rückstreuung (DE-588)4178653-1 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
topic_facet | Materials Science Characterization and Evaluation of Materials Animal Anatomy / Morphology / Histology Geochemistry Physical Chemistry Biochemistry, general Materials science Physical chemistry Biochemistry Animal anatomy Kristallographie Elektronenbeugung Rückstreuung Werkstoffkunde |
url | https://doi.org/10.1007/978-1-4757-3205-4 |
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