Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2003
|
| Schlagworte: | |
| Online-Zugang: | UBT01 Volltext |
| Zusammenfassung: | In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping |
| Beschreibung: | 1 Online-Ressource (XIX, 689 p) |
| ISBN: | 9781461502159 |
| DOI: | 10.1007/978-1-4615-0215-9 |
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| 100 | 1 | |a Goldstein, Joseph I. |e Verfasser |4 aut | |
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| 520 | |a In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping | ||
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Materials Science, general | |
| 650 | 4 | |a Science, general | |
| 650 | 4 | |a Biological Microscopy | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Science | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Materials / Surfaces | |
| 650 | 4 | |a Thin films | |
| 700 | 1 | |a Newbury, Dale E. |4 aut | |
| 700 | 1 | |a Echlin, Patrick |4 aut | |
| 700 | 1 | |a Joy, David C. |4 aut | |
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Datensatz im Suchindex
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| author | Goldstein, Joseph I. Newbury, Dale E. Echlin, Patrick Joy, David C. |
| author_facet | Goldstein, Joseph I. Newbury, Dale E. Echlin, Patrick Joy, David C. |
| author_role | aut aut aut aut |
| author_sort | Goldstein, Joseph I. |
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| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| doi_str_mv | 10.1007/978-1-4615-0215-9 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:06Z |
| institution | BVB |
| isbn | 9781461502159 |
| language | English |
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| spelling | Goldstein, Joseph I. Verfasser aut Scanning Electron Microscopy and X-ray Microanalysis Third Edition by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael Boston, MA Springer US 2003 1 Online-Ressource (XIX, 689 p) txt rdacontent c rdamedia cr rdacarrier In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping Materials Science Characterization and Evaluation of Materials Materials Science, general Science, general Biological Microscopy Surfaces and Interfaces, Thin Films Nanotechnology Materials science Science Microscopy Materials / Surfaces Thin films Newbury, Dale E. aut Echlin, Patrick aut Joy, David C. aut Erscheint auch als Druck-Ausgabe 9781461349693 https://doi.org/10.1007/978-1-4615-0215-9 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Goldstein, Joseph I. Newbury, Dale E. Echlin, Patrick Joy, David C. Scanning Electron Microscopy and X-ray Microanalysis Third Edition Materials Science Characterization and Evaluation of Materials Materials Science, general Science, general Biological Microscopy Surfaces and Interfaces, Thin Films Nanotechnology Materials science Science Microscopy Materials / Surfaces Thin films |
| title | Scanning Electron Microscopy and X-ray Microanalysis Third Edition |
| title_auth | Scanning Electron Microscopy and X-ray Microanalysis Third Edition |
| title_exact_search | Scanning Electron Microscopy and X-ray Microanalysis Third Edition |
| title_full | Scanning Electron Microscopy and X-ray Microanalysis Third Edition by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael |
| title_fullStr | Scanning Electron Microscopy and X-ray Microanalysis Third Edition by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael |
| title_full_unstemmed | Scanning Electron Microscopy and X-ray Microanalysis Third Edition by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael |
| title_short | Scanning Electron Microscopy and X-ray Microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis third edition |
| title_sub | Third Edition |
| topic | Materials Science Characterization and Evaluation of Materials Materials Science, general Science, general Biological Microscopy Surfaces and Interfaces, Thin Films Nanotechnology Materials science Science Microscopy Materials / Surfaces Thin films |
| topic_facet | Materials Science Characterization and Evaluation of Materials Materials Science, general Science, general Biological Microscopy Surfaces and Interfaces, Thin Films Nanotechnology Materials science Science Microscopy Materials / Surfaces Thin films |
| url | https://doi.org/10.1007/978-1-4615-0215-9 |
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