Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis:
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is...
Saved in:
| Other Authors: | , , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston, MA
Springer US
2002
|
| Series: | Methods of Surface Characterization
5 |
| Subjects: | |
| Online Access: | UBT01 Volltext |
| Summary: | Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior |
| Physical Description: | 1 Online-Ressource (XX, 430 p) |
| ISBN: | 9780306469145 |
| DOI: | 10.1007/b119182 |
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| 520 | |a Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior | ||
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| spelling | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis edited by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell Boston, MA Springer US 2002 1 Online-Ressource (XX, 430 p) txt rdacontent c rdamedia cr rdacarrier Methods of Surface Characterization 5 Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior Materials Science Characterization and Evaluation of Materials Optical and Electronic Materials Analytical Chemistry Materials science Analytical chemistry Optical materials Electronic materials Festkörper (DE-588)4016918-2 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Festkörper (DE-588)4016918-2 s Oberflächenanalyse (DE-588)4172243-7 s 1\p DE-604 Czanderna, Alvin W. edt Madey, Theodore E. edt Powell, Cedric J. edt Erscheint auch als Druck-Ausgabe 9780306458965 https://doi.org/10.1007/b119182 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis Materials Science Characterization and Evaluation of Materials Optical and Electronic Materials Analytical Chemistry Materials science Analytical chemistry Optical materials Electronic materials Festkörper (DE-588)4016918-2 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4016918-2 (DE-588)4172243-7 |
| title | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis |
| title_auth | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis |
| title_exact_search | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis |
| title_full | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis edited by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell |
| title_fullStr | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis edited by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell |
| title_full_unstemmed | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis edited by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell |
| title_short | Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis |
| title_sort | beam effects surface topography and depth profiling in surface analysis |
| topic | Materials Science Characterization and Evaluation of Materials Optical and Electronic Materials Analytical Chemistry Materials science Analytical chemistry Optical materials Electronic materials Festkörper (DE-588)4016918-2 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Materials Science Characterization and Evaluation of Materials Optical and Electronic Materials Analytical Chemistry Materials science Analytical chemistry Optical materials Electronic materials Festkörper Oberflächenanalyse |
| url | https://doi.org/10.1007/b119182 |
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