Pichler, P. (2004). Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon. Springer Vienna. https://doi.org/10.1007/978-3-7091-0597-9
Chicago Style (17th ed.) CitationPichler, Peter. Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon. Vienna: Springer Vienna, 2004. https://doi.org/10.1007/978-3-7091-0597-9.
MLA (9th ed.) CitationPichler, Peter. Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon. Springer Vienna, 2004. https://doi.org/10.1007/978-3-7091-0597-9.
Warning: These citations may not always be 100% accurate.