APA (7th ed.) Citation

Altet, J., & Rubio, A. (2002). Thermal Testing of Integrated Circuits. Springer US. https://doi.org/10.1007/978-1-4757-3635-9

Chicago Style (17th ed.) Citation

Altet, Josep, and Antonio Rubio. Thermal Testing of Integrated Circuits. Boston, MA: Springer US, 2002. https://doi.org/10.1007/978-1-4757-3635-9.

MLA (9th ed.) Citation

Altet, Josep, and Antonio Rubio. Thermal Testing of Integrated Circuits. Springer US, 2002. https://doi.org/10.1007/978-1-4757-3635-9.