Quantum metrology with photoelectrons, Volume 2, Applications and advances:
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelect...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA)
Morgan & Claypool Publishers
[2018]
|
| Schriftenreihe: | IOP (Series)
IOP concise physics |
| Schlagworte: | |
| Online-Zugang: | UBW01 Volltext |
| Zusammenfassung: | Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology |
| Beschreibung: | 1 online resource (various pagings) illustrations (chiefly color) |
| ISBN: | 9781681746883 9781681746906 |
| DOI: | 10.1088/978-1-6817-4688-3 |
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| isbn | 9781681746883 9781681746906 |
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| spelling | Hockett, Paul Verfasser aut Quantum metrology with photoelectrons, Volume 2, Applications and advances Paul Hockett San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) Morgan & Claypool Publishers [2018] Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) IOP Publishing [2018] 1 online resource (various pagings) illustrations (chiefly color) txt rdacontent c rdamedia cr rdacarrier IOP (Series) IOP concise physics Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology Quantum physics (quantum mechanics & quantum field theory) / bicssc SCIENCE / Physics / Quantum Theory / bisacsh Metrology Quantum measure theory Erscheint auch als Druck-Ausgabe 978-1-6817-4689-0 https://doi.org/10.1088/978-1-6817-4688-3 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Hockett, Paul Quantum metrology with photoelectrons, Volume 2, Applications and advances Quantum physics (quantum mechanics & quantum field theory) / bicssc SCIENCE / Physics / Quantum Theory / bisacsh Metrology Quantum measure theory |
| title | Quantum metrology with photoelectrons, Volume 2, Applications and advances |
| title_auth | Quantum metrology with photoelectrons, Volume 2, Applications and advances |
| title_exact_search | Quantum metrology with photoelectrons, Volume 2, Applications and advances |
| title_full | Quantum metrology with photoelectrons, Volume 2, Applications and advances Paul Hockett |
| title_fullStr | Quantum metrology with photoelectrons, Volume 2, Applications and advances Paul Hockett |
| title_full_unstemmed | Quantum metrology with photoelectrons, Volume 2, Applications and advances Paul Hockett |
| title_short | Quantum metrology with photoelectrons, Volume 2, Applications and advances |
| title_sort | quantum metrology with photoelectrons volume 2 applications and advances |
| topic | Quantum physics (quantum mechanics & quantum field theory) / bicssc SCIENCE / Physics / Quantum Theory / bisacsh Metrology Quantum measure theory |
| topic_facet | Quantum physics (quantum mechanics & quantum field theory) / bicssc SCIENCE / Physics / Quantum Theory / bisacsh Metrology Quantum measure theory |
| url | https://doi.org/10.1088/978-1-6817-4688-3 |
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