Electron beam-specimen interactions and simulation methods in microscopy:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Newark
John Wiley & Sons, Incorporated
2018
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| Series: | RMS - Royal Microscopical Society Ser
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| Subjects: | |
| Online Access: | Volltext |
| Item Description: | Description based on publisher supplied metadata and other sources |
| Physical Description: | 1 Online-Ressource |
| ISBN: | 9781118696552 9781118696545 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044995518 | ||
| 003 | DE-604 | ||
| 005 | 20200520 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180606s2018 |||| o||u| ||||||eng d | ||
| 020 | |a 9781118696552 |c Online |9 978-1-118-69655-2 | ||
| 020 | |a 9781118696545 |9 9781118696545 | ||
| 035 | |a (ZDB-30-PQE)EBC5325072 | ||
| 035 | |a (ZDB-89-EBL)EBL5325072 | ||
| 035 | |a (ZDB-38-EBR)ebr11532065 | ||
| 035 | |a (OCoLC)1029200052 | ||
| 035 | |a (DE-599)BVBBV044995518 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-83 | ||
| 082 | 0 | |a 006.3 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 100 | 1 | |a Mendis, Budhika G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron beam-specimen interactions and simulation methods in microscopy |
| 264 | 1 | |a Newark |b John Wiley & Sons, Incorporated |c 2018 | |
| 264 | 4 | |c © 2018 | |
| 300 | |a 1 Online-Ressource | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a RMS - Royal Microscopical Society Ser | |
| 500 | |a Description based on publisher supplied metadata and other sources | ||
| 650 | 4 | |a Electron beams | |
| 650 | 4 | |a Electron beams-Simulation methods | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 0 | 7 | |a Simulation |0 (DE-588)4055072-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenstrahl |0 (DE-588)4151894-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektronenstrahl |0 (DE-588)4151894-9 |D s |
| 689 | 1 | 1 | |a Simulation |0 (DE-588)4055072-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Mendis, Budhika G. |t Electron Beam-Specimen Interactions and Simulation Methods in Microscopy |d Newark : John Wiley & Sons, Incorporated,c2018 |z 9781118456095 |
| 856 | 4 | 0 | |u https://onlinelibrary.wiley.com/doi/book/10.1002/9781118696545 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-30-PQE |a ZDB-35-WIC |a ebook | ||
| 940 | 1 | |q FHR_PDA_WIC | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030387765 | ||
Record in the Search Index
| _version_ | 1804178596059676672 |
|---|---|
| any_adam_object | |
| author | Mendis, Budhika G. |
| author_facet | Mendis, Budhika G. |
| author_role | aut |
| author_sort | Mendis, Budhika G. |
| author_variant | b g m bg bgm |
| building | Verbundindex |
| bvnumber | BV044995518 |
| classification_rvk | UH 6300 |
| collection | ZDB-30-PQE ZDB-35-WIC ebook |
| ctrlnum | (ZDB-30-PQE)EBC5325072 (ZDB-89-EBL)EBL5325072 (ZDB-38-EBR)ebr11532065 (OCoLC)1029200052 (DE-599)BVBBV044995518 |
| dewey-full | 006.3 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 006 - Special computer methods |
| dewey-raw | 006.3 |
| dewey-search | 006.3 |
| dewey-sort | 16.3 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Physik Informatik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02093nmm a2200541zc 4500</leader><controlfield tag="001">BV044995518</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20200520 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180606s2018 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118696552</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-118-69655-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118696545</subfield><subfield code="9">9781118696545</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PQE)EBC5325072</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL5325072</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-EBR)ebr11532065</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1029200052</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044995518</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">006.3</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Mendis, Budhika G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron beam-specimen interactions and simulation methods in microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Newark</subfield><subfield code="b">John Wiley & Sons, Incorporated</subfield><subfield code="c">2018</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2018</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">RMS - Royal Microscopical Society Ser</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron beams</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron beams-Simulation methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Simulation</subfield><subfield code="0">(DE-588)4055072-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahl</subfield><subfield code="0">(DE-588)4151894-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenstrahl</subfield><subfield code="0">(DE-588)4151894-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Simulation</subfield><subfield code="0">(DE-588)4055072-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Mendis, Budhika G.</subfield><subfield code="t">Electron Beam-Specimen Interactions and Simulation Methods in Microscopy</subfield><subfield code="d">Newark : John Wiley & Sons, Incorporated,c2018</subfield><subfield code="z">9781118456095</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118696545</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield><subfield code="a">ZDB-35-WIC</subfield><subfield code="a">ebook</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FHR_PDA_WIC</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030387765</subfield></datafield></record></collection> |
| id | DE-604.BV044995518 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:06:29Z |
| institution | BVB |
| isbn | 9781118696552 9781118696545 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030387765 |
| oclc_num | 1029200052 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | 1 Online-Ressource |
| psigel | ZDB-30-PQE ZDB-35-WIC ebook FHR_PDA_WIC |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | John Wiley & Sons, Incorporated |
| record_format | marc |
| series2 | RMS - Royal Microscopical Society Ser |
| spelling | Mendis, Budhika G. Verfasser aut Electron beam-specimen interactions and simulation methods in microscopy Newark John Wiley & Sons, Incorporated 2018 © 2018 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier RMS - Royal Microscopical Society Ser Description based on publisher supplied metadata and other sources Electron beams Electron beams-Simulation methods Electron microscopy Simulation (DE-588)4055072-2 gnd rswk-swf Elektronenstrahl (DE-588)4151894-9 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Elektronenstrahl (DE-588)4151894-9 s Simulation (DE-588)4055072-2 s Erscheint auch als Druck-Ausgabe Mendis, Budhika G. Electron Beam-Specimen Interactions and Simulation Methods in Microscopy Newark : John Wiley & Sons, Incorporated,c2018 9781118456095 https://onlinelibrary.wiley.com/doi/book/10.1002/9781118696545 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Mendis, Budhika G. Electron beam-specimen interactions and simulation methods in microscopy Electron beams Electron beams-Simulation methods Electron microscopy Simulation (DE-588)4055072-2 gnd Elektronenstrahl (DE-588)4151894-9 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4055072-2 (DE-588)4151894-9 (DE-588)4014327-2 |
| title | Electron beam-specimen interactions and simulation methods in microscopy |
| title_auth | Electron beam-specimen interactions and simulation methods in microscopy |
| title_exact_search | Electron beam-specimen interactions and simulation methods in microscopy |
| title_full | Electron beam-specimen interactions and simulation methods in microscopy |
| title_fullStr | Electron beam-specimen interactions and simulation methods in microscopy |
| title_full_unstemmed | Electron beam-specimen interactions and simulation methods in microscopy |
| title_short | Electron beam-specimen interactions and simulation methods in microscopy |
| title_sort | electron beam specimen interactions and simulation methods in microscopy |
| topic | Electron beams Electron beams-Simulation methods Electron microscopy Simulation (DE-588)4055072-2 gnd Elektronenstrahl (DE-588)4151894-9 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron beams Electron beams-Simulation methods Electron microscopy Simulation Elektronenstrahl Elektronenmikroskopie |
| url | https://onlinelibrary.wiley.com/doi/book/10.1002/9781118696545 |
| work_keys_str_mv | AT mendisbudhikag electronbeamspecimeninteractionsandsimulationmethodsinmicroscopy |