Semiconductor strain metrology: principles and applications
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
[Saif Zone, Sharjah, U.A.E]
Bentham Science
[2012]
|
| Schlagworte: | |
| Beschreibung: | 136 p. |
| ISBN: | 9781608053599 |
Internformat
MARC
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| 008 | 180305s2012 |||| o||u| ||||||eng d | ||
| 020 | |a 9781608053599 |9 978-1-60805-359-9 | ||
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| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 100 | 1 | |a Wong, Terence K. S. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Semiconductor strain metrology |b principles and applications |c Terence K.S. Wong |
| 264 | 1 | |a [Saif Zone, Sharjah, U.A.E] |b Bentham Science |c [2012] | |
| 300 | |a 136 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Semiconductors |x Design and construction |x Materials | |
| 650 | 4 | |a Compound semiconductors |x Design and construction |x Materials | |
| 650 | 4 | |a Silicon-on-insulator technology | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030242975 | ||
Datensatz im Suchindex
| _version_ | 1804178362134953984 |
|---|---|
| any_adam_object | |
| author | Wong, Terence K. S. |
| author_facet | Wong, Terence K. S. |
| author_role | aut |
| author_sort | Wong, Terence K. S. |
| author_variant | t k s w tks tksw |
| building | Verbundindex |
| bvnumber | BV044848114 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10570978 (OCoLC)811371628 (DE-599)BVBBV044848114 |
| format | Electronic eBook |
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| id | DE-604.BV044848114 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:46Z |
| institution | BVB |
| isbn | 9781608053599 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030242975 |
| oclc_num | 811371628 |
| open_access_boolean | |
| physical | 136 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2012 |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| publisher | Bentham Science |
| record_format | marc |
| spelling | Wong, Terence K. S. Verfasser aut Semiconductor strain metrology principles and applications Terence K.S. Wong [Saif Zone, Sharjah, U.A.E] Bentham Science [2012] 136 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Semiconductors Design and construction Materials Compound semiconductors Design and construction Materials Silicon-on-insulator technology |
| spellingShingle | Wong, Terence K. S. Semiconductor strain metrology principles and applications Includes bibliographical references and index Semiconductors Design and construction Materials Compound semiconductors Design and construction Materials Silicon-on-insulator technology |
| title | Semiconductor strain metrology principles and applications |
| title_auth | Semiconductor strain metrology principles and applications |
| title_exact_search | Semiconductor strain metrology principles and applications |
| title_full | Semiconductor strain metrology principles and applications Terence K.S. Wong |
| title_fullStr | Semiconductor strain metrology principles and applications Terence K.S. Wong |
| title_full_unstemmed | Semiconductor strain metrology principles and applications Terence K.S. Wong |
| title_short | Semiconductor strain metrology |
| title_sort | semiconductor strain metrology principles and applications |
| title_sub | principles and applications |
| topic | Semiconductors Design and construction Materials Compound semiconductors Design and construction Materials Silicon-on-insulator technology |
| topic_facet | Semiconductors Design and construction Materials Compound semiconductors Design and construction Materials Silicon-on-insulator technology |
| work_keys_str_mv | AT wongterenceks semiconductorstrainmetrologyprinciplesandapplications |