Wafer-level testing and test during burn-in for integrated circuits:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston
Artech House
2010
|
| Series: | Artech House integrated microsystems series
|
| Subjects: | |
| Physical Description: | xv, 198 p. |
| ISBN: | 9781596939899 1596939893 |
Staff View
MARC
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| 100 | 1 | |a Bahukudumbi, Sudarshan |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Wafer-level testing and test during burn-in for integrated circuits |c Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| 264 | 1 | |a Boston |b Artech House |c 2010 | |
| 300 | |a xv, 198 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
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| 490 | 0 | |a Artech House integrated microsystems series | |
| 505 | 8 | |a Includes bibliographical references and index | |
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| 650 | 4 | |a Integrated circuits |x Wafer-scale integration | |
| 650 | 4 | |a Semiconductors |x Testing | |
| 700 | 1 | |a Chakrabarty, Krishnendu |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030238448 | ||
Record in the Search Index
| _version_ | 1804178353879515136 |
|---|---|
| any_adam_object | |
| author | Bahukudumbi, Sudarshan |
| author_facet | Bahukudumbi, Sudarshan |
| author_role | aut |
| author_sort | Bahukudumbi, Sudarshan |
| author_variant | s b sb |
| building | Verbundindex |
| bvnumber | BV044843585 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10412729 (OCoLC)672293639 (DE-599)BVBBV044843585 |
| dewey-full | 621.38132 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38132 |
| dewey-search | 621.38132 |
| dewey-sort | 3621.38132 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044843585 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:38Z |
| institution | BVB |
| isbn | 9781596939899 1596939893 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030238448 |
| oclc_num | 672293639 |
| open_access_boolean | |
| physical | xv, 198 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House integrated microsystems series |
| spelling | Bahukudumbi, Sudarshan Verfasser aut Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty Boston Artech House 2010 xv, 198 p. txt rdacontent c rdamedia cr rdacarrier Artech House integrated microsystems series Includes bibliographical references and index Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing Chakrabarty, Krishnendu Sonstige oth |
| spellingShingle | Bahukudumbi, Sudarshan Wafer-level testing and test during burn-in for integrated circuits Includes bibliographical references and index Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing |
| title | Wafer-level testing and test during burn-in for integrated circuits |
| title_auth | Wafer-level testing and test during burn-in for integrated circuits |
| title_exact_search | Wafer-level testing and test during burn-in for integrated circuits |
| title_full | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| title_fullStr | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| title_full_unstemmed | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| title_short | Wafer-level testing and test during burn-in for integrated circuits |
| title_sort | wafer level testing and test during burn in for integrated circuits |
| topic | Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing |
| topic_facet | Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing |
| work_keys_str_mv | AT bahukudumbisudarshan waferleveltestingandtestduringburninforintegratedcircuits AT chakrabartykrishnendu waferleveltestingandtestduringburninforintegratedcircuits |