APA (7th ed.) Citation

(2006). VLSI test principles and architectures: Design for testability. Elsevier Morgan Kaufmann Publishers.

Chicago Style (17th ed.) Citation

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

MLA (9th ed.) Citation

VLSI Test Principles and Architectures: Design for Testability. Elsevier Morgan Kaufmann Publishers, 2006.

Warning: These citations may not always be 100% accurate.