Particle characterization: light scattering methods
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
New York
Kluwer Academic
c2002
|
| Series: | Particle technology series (Kluwer Academic Publishers)
13 |
| Subjects: | |
| Physical Description: | xv, 397 p. |
| ISBN: | 0306471248 |
Staff View
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044830784 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2002 |||| o||u| ||||||eng d | ||
| 020 | |a 0306471248 |c Online |9 0-306-47124-8 | ||
| 035 | |a (ZDB-38-ESG)ebr10051575 | ||
| 035 | |a (OCoLC)50175024 | ||
| 035 | |a (DE-599)BVBBV044830784 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 100 | 1 | |a Xu, Renliang |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Particle characterization |b light scattering methods |c by Renliang Xu |
| 264 | 1 | |a New York |b Kluwer Academic |c c2002 | |
| 300 | |a xv, 397 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Particle technology series (Kluwer Academic Publishers) |v 13 | |
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Particles |x Analysis | |
| 650 | 4 | |a Light |x Scattering | |
| 650 | 4 | |a Particle size determination | |
| 650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Teilchenmesstechnik |0 (DE-588)4129617-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Teilchenmesstechnik |0 (DE-588)4129617-5 |D s |
| 689 | 0 | 1 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030225649 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804178331680112640 |
|---|---|
| any_adam_object | |
| author | Xu, Renliang |
| author_facet | Xu, Renliang |
| author_role | aut |
| author_sort | Xu, Renliang |
| author_variant | r x rx |
| building | Verbundindex |
| bvnumber | BV044830784 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10051575 (OCoLC)50175024 (DE-599)BVBBV044830784 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01393nmm a2200397zcb4500</leader><controlfield tag="001">BV044830784</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2002 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0306471248</subfield><subfield code="c">Online</subfield><subfield code="9">0-306-47124-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10051575</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)50175024</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044830784</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Xu, Renliang</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Particle characterization</subfield><subfield code="b">light scattering methods</subfield><subfield code="c">by Renliang Xu</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Kluwer Academic</subfield><subfield code="c">c2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xv, 397 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Particle technology series (Kluwer Academic Publishers)</subfield><subfield code="v">13</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Particles</subfield><subfield code="x">Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Light</subfield><subfield code="x">Scattering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Particle size determination</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Teilchenmesstechnik</subfield><subfield code="0">(DE-588)4129617-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Teilchenmesstechnik</subfield><subfield code="0">(DE-588)4129617-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030225649</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV044830784 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:17Z |
| institution | BVB |
| isbn | 0306471248 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030225649 |
| oclc_num | 50175024 |
| open_access_boolean | |
| physical | xv, 397 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Kluwer Academic |
| record_format | marc |
| series2 | Particle technology series (Kluwer Academic Publishers) |
| spelling | Xu, Renliang Verfasser aut Particle characterization light scattering methods by Renliang Xu New York Kluwer Academic c2002 xv, 397 p. txt rdacontent c rdamedia cr rdacarrier Particle technology series (Kluwer Academic Publishers) 13 Includes bibliographical references and index Particles Analysis Light Scattering Particle size determination Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Teilchenmesstechnik (DE-588)4129617-5 gnd rswk-swf Teilchenmesstechnik (DE-588)4129617-5 s Optische Messtechnik (DE-588)4172667-4 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Xu, Renliang Particle characterization light scattering methods Includes bibliographical references and index Particles Analysis Light Scattering Particle size determination Optische Messtechnik (DE-588)4172667-4 gnd Teilchenmesstechnik (DE-588)4129617-5 gnd |
| subject_GND | (DE-588)4172667-4 (DE-588)4129617-5 |
| title | Particle characterization light scattering methods |
| title_auth | Particle characterization light scattering methods |
| title_exact_search | Particle characterization light scattering methods |
| title_full | Particle characterization light scattering methods by Renliang Xu |
| title_fullStr | Particle characterization light scattering methods by Renliang Xu |
| title_full_unstemmed | Particle characterization light scattering methods by Renliang Xu |
| title_short | Particle characterization |
| title_sort | particle characterization light scattering methods |
| title_sub | light scattering methods |
| topic | Particles Analysis Light Scattering Particle size determination Optische Messtechnik (DE-588)4172667-4 gnd Teilchenmesstechnik (DE-588)4129617-5 gnd |
| topic_facet | Particles Analysis Light Scattering Particle size determination Optische Messtechnik Teilchenmesstechnik |
| work_keys_str_mv | AT xurenliang particlecharacterizationlightscatteringmethods |