Electron microscopy and analysis:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
London
Taylor & Francis
2001
|
| Edition: | 3rd ed |
| Subjects: | |
| Item Description: | Previous ed.: 1988 |
| Physical Description: | xi, 251 p. |
| ISBN: | 0748409688 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044829712 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2001 |||| o||u| ||||||eng d | ||
| 015 | |a GBA1-43398 |2 dnb | ||
| 020 | |a 0748409688 |c pbk. |9 0-7484-0968-8 | ||
| 035 | |a (ZDB-38-ESG)ebr10017829 | ||
| 035 | |a (OCoLC)70724582 | ||
| 035 | |a (DE-599)BVBBV044829712 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 502.825 |2 21 | |
| 100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew, John Humphreys, Richard Beanland |
| 250 | |a 3rd ed | ||
| 264 | 1 | |a London |b Taylor & Francis |c 2001 | |
| 300 | |a xi, 251 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Previous ed.: 1988 | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Beanland, R. |e Sonstige |4 oth | |
| 700 | 1 | |a Humphreys, F. J. |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030224578 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804178330014973952 |
|---|---|
| any_adam_object | |
| author | Goodhew, Peter J. |
| author_facet | Goodhew, Peter J. |
| author_role | aut |
| author_sort | Goodhew, Peter J. |
| author_variant | p j g pj pjg |
| building | Verbundindex |
| bvnumber | BV044829712 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10017829 (OCoLC)70724582 (DE-599)BVBBV044829712 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | 3rd ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01341nmm a2200409zc 4500</leader><controlfield tag="001">BV044829712</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2001 |||| o||u| ||||||eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">GBA1-43398</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0748409688</subfield><subfield code="c">pbk.</subfield><subfield code="9">0-7484-0968-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10017829</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)70724582</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044829712</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.825</subfield><subfield code="2">21</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Goodhew, Peter J.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron microscopy and analysis</subfield><subfield code="c">Peter J. Goodhew, John Humphreys, Richard Beanland</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">3rd ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London</subfield><subfield code="b">Taylor & Francis</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xi, 251 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Previous ed.: 1988</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Beanland, R.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Humphreys, F. J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030224578</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV044829712 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:15Z |
| institution | BVB |
| isbn | 0748409688 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030224578 |
| oclc_num | 70724582 |
| open_access_boolean | |
| physical | xi, 251 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Taylor & Francis |
| record_format | marc |
| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland 3rd ed London Taylor & Francis 2001 xi, 251 p. txt rdacontent c rdamedia cr rdacarrier Previous ed.: 1988 Includes bibliographical references and index Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s 1\p DE-604 Beanland, R. Sonstige oth Humphreys, F. J. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goodhew, Peter J. Electron microscopy and analysis Includes bibliographical references and index Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Electron microscopy and analysis |
| title_auth | Electron microscopy and analysis |
| title_exact_search | Electron microscopy and analysis |
| title_full | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_fullStr | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_short | Electron microscopy and analysis |
| title_sort | electron microscopy and analysis |
| topic | Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Elektronenmikroskopie |
| work_keys_str_mv | AT goodhewpeterj electronmicroscopyandanalysis AT beanlandr electronmicroscopyandanalysis AT humphreysfj electronmicroscopyandanalysis |