Electron microscopy and analysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Taylor & Francis
2001
|
| Ausgabe: | 3rd ed |
| Schlagworte: | |
| Beschreibung: | Previous ed.: 1988 |
| Beschreibung: | xi, 251 p. |
| ISBN: | 0748409688 |
Internformat
MARC
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| 100 | 1 | |a Goodhew, Peter J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electron microscopy and analysis |c Peter J. Goodhew, John Humphreys, Richard Beanland |
| 250 | |a 3rd ed | ||
| 264 | 1 | |a London |b Taylor & Francis |c 2001 | |
| 300 | |a xi, 251 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Previous ed.: 1988 | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Electron microscopy | |
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| 700 | 1 | |a Beanland, R. |e Sonstige |4 oth | |
| 700 | 1 | |a Humphreys, F. J. |e Sonstige |4 oth | |
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Datensatz im Suchindex
| _version_ | 1804178330014973952 |
|---|---|
| any_adam_object | |
| author | Goodhew, Peter J. |
| author_facet | Goodhew, Peter J. |
| author_role | aut |
| author_sort | Goodhew, Peter J. |
| author_variant | p j g pj pjg |
| building | Verbundindex |
| bvnumber | BV044829712 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10017829 (OCoLC)70724582 (DE-599)BVBBV044829712 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | 3rd ed |
| format | Electronic eBook |
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| id | DE-604.BV044829712 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:15Z |
| institution | BVB |
| isbn | 0748409688 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030224578 |
| oclc_num | 70724582 |
| open_access_boolean | |
| physical | xi, 251 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Taylor & Francis |
| record_format | marc |
| spelling | Goodhew, Peter J. Verfasser aut Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland 3rd ed London Taylor & Francis 2001 xi, 251 p. txt rdacontent c rdamedia cr rdacarrier Previous ed.: 1988 Includes bibliographical references and index Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s 1\p DE-604 Beanland, R. Sonstige oth Humphreys, F. J. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goodhew, Peter J. Electron microscopy and analysis Includes bibliographical references and index Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Electron microscopy and analysis |
| title_auth | Electron microscopy and analysis |
| title_exact_search | Electron microscopy and analysis |
| title_full | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_fullStr | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_full_unstemmed | Electron microscopy and analysis Peter J. Goodhew, John Humphreys, Richard Beanland |
| title_short | Electron microscopy and analysis |
| title_sort | electron microscopy and analysis |
| topic | Electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Elektronenmikroskopie |
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