Metric in measure spaces:
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Bibliographic Details
Main Author: Yeh, James 1927- (Author)
Format: Book
Language:English
Published: New Jersey World Scientific [2020]
Subjects:
Physical Description:x, 297 Seiten
ISBN:9789813200395
9789813200401

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!