Holdings: Industrial X-Ray Computed Tomography

Industrial X-Ray Computed Tomography:

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Bibliographic Details
Other Authors:	Carmignato, Simone (Editor), Dewulf, Wim (Editor), Leach, Richard (Editor)
Format:	Electronic eBook
Language:	English
Published:	Cham Springer International Publishing 2018
Subjects:	Materials science Atoms Physics Manufacturing industries Machines Tools Optical materials Electronic materials Materials Science Characterization and Evaluation of Materials Manufacturing, Machines, Tools Optical and Electronic Materials Atomic, Molecular, Optical and Plasma Physics Industrie Computertomografie Aufsatzsammlung
Online Access:	DE-634 DE-91 Volltext
Physical Description:	1 Online-Ressource (VII, 369 Seiten)
ISBN:	9783319595733
DOI:	10.1007/978-3-319-59573-3

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MARC


LEADER	00000nmm a2200000zc 4500
001	BV044703307
003	DE-604
005	20241002
007	cr\|uuu---uuuuu
008	180108s2018 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9783319595733 \|c Online \|9 978-3-319-59573-3
024	7		\|a 10.1007/978-3-319-59573-3 \|2 doi
035			\|a (ZDB-2-CMS)9783319595733
035			\|a (OCoLC)1018470064
035			\|a (DE-599)BVBBV044703307
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-634 \|a DE-91 \|a DE-83
082	0		\|a 620.11 \|2 23
084			\|a ZM 3700 \|0 (DE-625)157028: \|2 rvk
084			\|a WER 770f \|2 stub
084			\|a CHE 000 \|2 stub
245	1	0	\|a Industrial X-Ray Computed Tomography \|c Simone Carmignato, Wim Dewulf, Richard Leach editors
264		1	\|a Cham \|b Springer International Publishing \|c 2018
300			\|a 1 Online-Ressource (VII, 369 Seiten)
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
650		4	\|a Materials science
650		4	\|a Atoms
650		4	\|a Physics
650		4	\|a Manufacturing industries
650		4	\|a Machines
650		4	\|a Tools
650		4	\|a Optical materials
650		4	\|a Electronic materials
650		4	\|a Materials Science
650		4	\|a Characterization and Evaluation of Materials
650		4	\|a Manufacturing, Machines, Tools
650		4	\|a Optical and Electronic Materials
650		4	\|a Atomic, Molecular, Optical and Plasma Physics
650	0	7	\|a Industrie \|0 (DE-588)4026779-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Computertomografie \|0 (DE-588)4113240-3 \|2 gnd \|9 rswk-swf
655		7	\|8 1\p \|0 (DE-588)4143413-4 \|a Aufsatzsammlung \|2 gnd-content
689	0	0	\|a Computertomografie \|0 (DE-588)4113240-3 \|D s
689	0	1	\|a Industrie \|0 (DE-588)4026779-9 \|D s
689	0		\|5 DE-604
700	1		\|a Carmignato, Simone \|4 edt
700	1		\|a Dewulf, Wim \|4 edt
700	1		\|a Leach, Richard \|0 (DE-588)103694798X \|4 edt
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-319-59571-9
856	4	0	\|u https://doi.org/10.1007/978-3-319-59573-3 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
912			\|a ZDB-2-CMS
940	1		\|q ZDB-2-CMS_2018
943	1		\|a oai:aleph.bib-bvb.de:BVB01-030099980
966	e		\|u https://doi.org/10.1007/978-3-319-59573-3 \|l DE-634 \|p ZDB-2-CMS \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-319-59573-3 \|l DE-91 \|p ZDB-2-CMS \|x Verlag \|3 Volltext

Record in the Search Index

_version_	1811788395049910272
adam_text
any_adam_object
author2	Carmignato, Simone Dewulf, Wim Leach, Richard
author2_role	edt edt edt
author2_variant	s c sc w d wd r l rl
author_GND	(DE-588)103694798X
author_facet	Carmignato, Simone Dewulf, Wim Leach, Richard
building	Verbundindex
bvnumber	BV044703307
classification_rvk	ZM 3700
classification_tum	WER 770f CHE 000
collection	ZDB-2-CMS
ctrlnum	(ZDB-2-CMS)9783319595733 (OCoLC)1018470064 (DE-599)BVBBV044703307
dewey-full	620.11
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	620 - Engineering and allied operations
dewey-raw	620.11
dewey-search	620.11
dewey-sort	3620.11
dewey-tens	620 - Engineering and allied operations
discipline	Werkstoffwissenschaften Chemie Werkstoffwissenschaften / Fertigungstechnik
doi_str_mv	10.1007/978-3-319-59573-3
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV044703307</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20241002</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">180108s2018 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319595733</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-59573-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-59573-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-CMS)9783319595733</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1018470064</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044703307</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.11</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3700</subfield><subfield code="0">(DE-625)157028:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WER 770f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">CHE 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Industrial X-Ray Computed Tomography</subfield><subfield code="c">Simone Carmignato, Wim Dewulf, Richard Leach editors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2018</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (VII, 369 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Atoms</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Manufacturing industries</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Machines</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Tools</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Science</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Manufacturing, Machines, Tools</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Atomic, Molecular, Optical and Plasma Physics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Industrie</subfield><subfield code="0">(DE-588)4026779-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computertomografie</subfield><subfield code="0">(DE-588)4113240-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Computertomografie</subfield><subfield code="0">(DE-588)4113240-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Industrie</subfield><subfield code="0">(DE-588)4026779-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Carmignato, Simone</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dewulf, Wim</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leach, Richard</subfield><subfield code="0">(DE-588)103694798X</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-319-59571-9</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-59573-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-CMS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-CMS_2018</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030099980</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-59573-3</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-CMS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-59573-3</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-2-CMS</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
genre	1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content
genre_facet	Aufsatzsammlung
id	DE-604.BV044703307
illustrated	Not Illustrated
indexdate	2024-10-02T08:00:58Z
institution	BVB
isbn	9783319595733
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030099980
oclc_num	1018470064
open_access_boolean
owner	DE-634 DE-91 DE-BY-TUM DE-83
owner_facet	DE-634 DE-91 DE-BY-TUM DE-83
physical	1 Online-Ressource (VII, 369 Seiten)
psigel	ZDB-2-CMS ZDB-2-CMS_2018
publishDate	2018
publishDateSearch	2018
publishDateSort	2018
publisher	Springer International Publishing
record_format	marc
spelling	Industrial X-Ray Computed Tomography Simone Carmignato, Wim Dewulf, Richard Leach editors Cham Springer International Publishing 2018 1 Online-Ressource (VII, 369 Seiten) txt rdacontent c rdamedia cr rdacarrier Materials science Atoms Physics Manufacturing industries Machines Tools Optical materials Electronic materials Materials Science Characterization and Evaluation of Materials Manufacturing, Machines, Tools Optical and Electronic Materials Atomic, Molecular, Optical and Plasma Physics Industrie (DE-588)4026779-9 gnd rswk-swf Computertomografie (DE-588)4113240-3 gnd rswk-swf 1\p (DE-588)4143413-4 Aufsatzsammlung gnd-content Computertomografie (DE-588)4113240-3 s Industrie (DE-588)4026779-9 s DE-604 Carmignato, Simone edt Dewulf, Wim edt Leach, Richard (DE-588)103694798X edt Erscheint auch als Druck-Ausgabe 978-3-319-59571-9 https://doi.org/10.1007/978-3-319-59573-3 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Industrial X-Ray Computed Tomography Materials science Atoms Physics Manufacturing industries Machines Tools Optical materials Electronic materials Materials Science Characterization and Evaluation of Materials Manufacturing, Machines, Tools Optical and Electronic Materials Atomic, Molecular, Optical and Plasma Physics Industrie (DE-588)4026779-9 gnd Computertomografie (DE-588)4113240-3 gnd
subject_GND	(DE-588)4026779-9 (DE-588)4113240-3 (DE-588)4143413-4
title	Industrial X-Ray Computed Tomography
title_auth	Industrial X-Ray Computed Tomography
title_exact_search	Industrial X-Ray Computed Tomography
title_full	Industrial X-Ray Computed Tomography Simone Carmignato, Wim Dewulf, Richard Leach editors
title_fullStr	Industrial X-Ray Computed Tomography Simone Carmignato, Wim Dewulf, Richard Leach editors
title_full_unstemmed	Industrial X-Ray Computed Tomography Simone Carmignato, Wim Dewulf, Richard Leach editors
title_short	Industrial X-Ray Computed Tomography
title_sort	industrial x ray computed tomography
topic	Materials science Atoms Physics Manufacturing industries Machines Tools Optical materials Electronic materials Materials Science Characterization and Evaluation of Materials Manufacturing, Machines, Tools Optical and Electronic Materials Atomic, Molecular, Optical and Plasma Physics Industrie (DE-588)4026779-9 gnd Computertomografie (DE-588)4113240-3 gnd
topic_facet	Materials science Atoms Physics Manufacturing industries Machines Tools Optical materials Electronic materials Materials Science Characterization and Evaluation of Materials Manufacturing, Machines, Tools Optical and Electronic Materials Atomic, Molecular, Optical and Plasma Physics Industrie Computertomografie Aufsatzsammlung
url	https://doi.org/10.1007/978-3-319-59573-3
work_keys_str_mv	AT carmignatosimone industrialxraycomputedtomography AT dewulfwim industrialxraycomputedtomography AT leachrichard industrialxraycomputedtomography

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