VLSI design and test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers
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Bibliographic Details
Other Authors: Kaushik, Brajesh Kumar (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Editor)
Format: Electronic eBook
Language:English
Published: Singapore Springer [2017]
Series:Communications in Computer and Information Science 711
Subjects:
Online Access:BTU01
FHA01
FHI01
FHM01
FHN01
FHR01
FKE01
FLA01
FRO01
FWS01
FWS02
HTW01
UBG01
UBM01
UBR01
UBT01
UBW01
UBY01
UER01
UPA01
Volltext
Physical Description:1 Online-Ressource (XXI, 815 Seiten, 486 illus)
ISBN:9789811074707
ISSN:1865-0929
DOI:10.1007/978-981-10-7470-7