Radiation effects and soft errors in integrated circuits and electronic devices:
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Singapore
World Scientific Pub. Co.
c2004
|
| Series: | Selected topics in electronics and systems
vol. 34 |
| Subjects: | |
| Online Access: | FHN01 Volltext |
| Summary: | This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level |
| Item Description: | Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623 |
| Physical Description: | viii, 339 p. ill |
| ISBN: | 9789812794703 |
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| id | DE-604.BV044635634 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:57:47Z |
| institution | BVB |
| isbn | 9789812794703 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030033606 |
| oclc_num | 1012725061 |
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| physical | viii, 339 p. ill |
| psigel | ZDB-124-WOP ZDB-124-WOP FHN_PDA_WOP |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | World Scientific Pub. Co. |
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| series2 | Selected topics in electronics and systems |
| spelling | Radiation effects and soft errors in integrated circuits and electronic devices editors, R.D. Schrimpf, D.M. Fleetwood Singapore World Scientific Pub. Co. c2004 viii, 339 p. ill txt rdacontent c rdamedia cr rdacarrier Selected topics in electronics and systems vol. 34 Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623 This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level Electronic circuits / Effect of radiation on Integrated circuits / Effect of radiation on Schrimpf, Ronald Donald Sonstige oth Fleetwood, D. M. Sonstige oth Erscheint auch als Druck-Ausgabe 9789812389404 Erscheint auch als Druck-Ausgabe 9812389407 http://www.worldscientific.com/worldscibooks/10.1142/5607#t=toc Verlag URL des Erstveroeffentlichers Volltext |
| spellingShingle | Radiation effects and soft errors in integrated circuits and electronic devices Electronic circuits / Effect of radiation on Integrated circuits / Effect of radiation on |
| title | Radiation effects and soft errors in integrated circuits and electronic devices |
| title_auth | Radiation effects and soft errors in integrated circuits and electronic devices |
| title_exact_search | Radiation effects and soft errors in integrated circuits and electronic devices |
| title_full | Radiation effects and soft errors in integrated circuits and electronic devices editors, R.D. Schrimpf, D.M. Fleetwood |
| title_fullStr | Radiation effects and soft errors in integrated circuits and electronic devices editors, R.D. Schrimpf, D.M. Fleetwood |
| title_full_unstemmed | Radiation effects and soft errors in integrated circuits and electronic devices editors, R.D. Schrimpf, D.M. Fleetwood |
| title_short | Radiation effects and soft errors in integrated circuits and electronic devices |
| title_sort | radiation effects and soft errors in integrated circuits and electronic devices |
| topic | Electronic circuits / Effect of radiation on Integrated circuits / Effect of radiation on |
| topic_facet | Electronic circuits / Effect of radiation on Integrated circuits / Effect of radiation on |
| url | http://www.worldscientific.com/worldscibooks/10.1142/5607#t=toc |
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