Measurement technology and its application III: selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | , |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Zurich, Switzerland
TTP
2014
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| Schriftenreihe: | Applied Mechanics and Materials
Volume 568-570 |
| Schlagworte: | |
| Beschreibung: | Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014) Paralleltitel: ICMIA 2014 |
| Beschreibung: | 1 online resource (2012 pages) illustrations (some color), graphs, tables |
| ISBN: | 9783038265214 |
| ISSN: | 1662-7482 |
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| 500 | |a Paralleltitel: ICMIA 2014 | ||
| 650 | 4 | |a Detectors |v Congresses | |
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| 650 | 4 | |a Measuring instruments |v Congresses | |
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Datensatz im Suchindex
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| author_facet | Yarlagadda, Prasad Kim, Yun-Hae International Conference on Measurement, Instrumentation and Automation < 2014, Shanghai, China> |
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| dewey-full | 681.2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 681 - Precision instruments and other devices |
| dewey-raw | 681.2 |
| dewey-search | 681.2 |
| dewey-sort | 3681.2 |
| dewey-tens | 680 - Manufacture of products for specific uses |
| discipline | Handwerk und Gewerbe / Verschiedene Technologien |
| format | Electronic eBook |
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| indexdate | 2024-07-10T07:56:16Z |
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| isbn | 9783038265214 |
| issn | 1662-7482 |
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| spelling | International Conference on Measurement, Instrumentation and Automation < 2014, Shanghai, China> Verfasser aut Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China edited by Prasad Yarlagadda and Yun-Hae Kim ICMIA 2014 Zurich, Switzerland TTP 2014 © 2014 1 online resource (2012 pages) illustrations (some color), graphs, tables txt rdacontent c rdamedia cr rdacarrier Applied Mechanics and Materials Volume 568-570 Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014) Paralleltitel: ICMIA 2014 Detectors Congresses Measurement Congresses Measuring instruments Congresses (DE-588)1071861417 Konferenzschrift gnd-content Yarlagadda, Prasad edt Kim, Yun-Hae edt Erscheint auch als Druck-Ausgabe International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China) Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China Zurich, Switzerland : TTP, c2014 2021 pages Applied mechanics and materials ; Volume 568-570 1662-7482 9783038351382 |
| spellingShingle | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China Detectors Congresses Measurement Congresses Measuring instruments Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China |
| title_alt | ICMIA 2014 |
| title_auth | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China |
| title_exact_search | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China |
| title_full | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China edited by Prasad Yarlagadda and Yun-Hae Kim |
| title_fullStr | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China edited by Prasad Yarlagadda and Yun-Hae Kim |
| title_full_unstemmed | Measurement technology and its application III selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China edited by Prasad Yarlagadda and Yun-Hae Kim |
| title_short | Measurement technology and its application III |
| title_sort | measurement technology and its application iii selected peer reviewed papers from the 2014 3rd international conference on measurement instrumentation and automation icmia 2014 april 23 24 2014 shanghai china |
| title_sub | selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China |
| topic | Detectors Congresses Measurement Congresses Measuring instruments Congresses |
| topic_facet | Detectors Congresses Measurement Congresses Measuring instruments Congresses Konferenzschrift |
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