VLSI reliability:
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
San Diego
Academic Press
1990
|
| Series: | VLSI electronics
v. 22 |
| Subjects: | |
| Online Access: | FAW01 Volltext |
| Summary: | As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | 1 online resource (xiii, 207 pages) illustrations |
| ISBN: | 9781483296586 148329658X 0122341228 9780122341229 |
Staff View
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| 650 | 7 | |a Integrated circuits / Very large scale integration / Reliability |2 fast | |
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| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044389649 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:51:37Z |
| institution | BVB |
| isbn | 9781483296586 148329658X 0122341228 9780122341229 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029791871 |
| oclc_num | 893872955 |
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| owner | DE-1046 |
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| physical | 1 online resource (xiii, 207 pages) illustrations |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Academic Press |
| record_format | marc |
| series2 | VLSI electronics |
| spelling | Sabnis, Anant G. Verfasser aut VLSI reliability Anant G. Sabnis San Diego Academic Press 1990 1 online resource (xiii, 207 pages) illustrations txt rdacontent c rdamedia cr rdacarrier VLSI electronics v. 22 Includes bibliographical references and index As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging Integrated circuits / Very large scale integration / Reliability fast Fiabilité ram Circuits intégrés à très grande échelle ram Integrated circuits Very large scale integration Reliability Erscheint auch als Druck-Ausgabe Sabnis, Anant G. VLSI reliability 0122341228 http://www.sciencedirect.com/science/bookseries/07367031/22 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Sabnis, Anant G. VLSI reliability Integrated circuits / Very large scale integration / Reliability fast Fiabilité ram Circuits intégrés à très grande échelle ram Integrated circuits Very large scale integration Reliability |
| title | VLSI reliability |
| title_auth | VLSI reliability |
| title_exact_search | VLSI reliability |
| title_full | VLSI reliability Anant G. Sabnis |
| title_fullStr | VLSI reliability Anant G. Sabnis |
| title_full_unstemmed | VLSI reliability Anant G. Sabnis |
| title_short | VLSI reliability |
| title_sort | vlsi reliability |
| topic | Integrated circuits / Very large scale integration / Reliability fast Fiabilité ram Circuits intégrés à très grande échelle ram Integrated circuits Very large scale integration Reliability |
| topic_facet | Integrated circuits / Very large scale integration / Reliability Fiabilité Circuits intégrés à très grande échelle Integrated circuits Very large scale integration Reliability |
| url | http://www.sciencedirect.com/science/bookseries/07367031/22 |
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