Advances in imaging and electron physics, Volume 163:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
Elsevier
2010
|
| Schlagworte: | |
| Online-Zugang: | FAW01 URL des Erstveröffentlichers |
| Beschreibung: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians |
| Beschreibung: | xiv, 228, [6] pages of plates |
| ISBN: | 0123813158 9780123813152 9780123813145 012381314X |
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| 264 | 1 | |a Amsterdam |b Elsevier |c 2010 | |
| 300 | |a xiv, 228, [6] pages of plates | ||
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| indexdate | 2024-07-10T07:51:33Z |
| institution | BVB |
| isbn | 0123813158 9780123813152 9780123813145 012381314X |
| language | English |
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| physical | xiv, 228, [6] pages of plates |
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| spelling | Advances in imaging and electron physics, Volume 163 edited by Peter W. Hawkes Amsterdam Elsevier 2010 xiv, 228, [6] pages of plates txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians Electrical engineering Engineering SCIENCE / Microscopes & Microscopy bisacsh Electron microscopes fast Electrons fast Ingenieurwissenschaften Electron microscopes Electrons Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/163 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 163 Electrical engineering Engineering SCIENCE / Microscopes & Microscopy bisacsh Electron microscopes fast Electrons fast Ingenieurwissenschaften Electron microscopes Electrons |
| title | Advances in imaging and electron physics, Volume 163 |
| title_auth | Advances in imaging and electron physics, Volume 163 |
| title_exact_search | Advances in imaging and electron physics, Volume 163 |
| title_full | Advances in imaging and electron physics, Volume 163 edited by Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics, Volume 163 edited by Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 163 edited by Peter W. Hawkes |
| title_short | Advances in imaging and electron physics, Volume 163 |
| title_sort | advances in imaging and electron physics volume 163 |
| topic | Electrical engineering Engineering SCIENCE / Microscopes & Microscopy bisacsh Electron microscopes fast Electrons fast Ingenieurwissenschaften Electron microscopes Electrons |
| topic_facet | Electrical engineering Engineering SCIENCE / Microscopes & Microscopy Electron microscopes Electrons Ingenieurwissenschaften |
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