Advances in imaging and electron physics, Volume 130:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Amsterdam
Elsevier/Academic Press
©2004
|
| Subjects: | |
| Online Access: | FAW01 Volltext |
| Item Description: | Includes bibliographical references and index The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R & D designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it's application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material |
| Physical Description: | xv, 315 pages |
| ISBN: | 9780080493268 0080493262 0120147726 9780120147724 |
Staff View
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| id | DE-604.BV044383908 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:26Z |
| institution | BVB |
| isbn | 9780080493268 0080493262 0120147726 9780120147724 |
| language | English |
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| physical | xv, 315 pages |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 2004 |
| publishDateSearch | 2004 |
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| publisher | Elsevier/Academic Press |
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| spelling | Advances in imaging and electron physics, Volume 130 edited by Peter W. Hawkes Amsterdam Elsevier/Academic Press ©2004 xv, 315 pages txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R & D designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it's application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopes fast Electrons fast Image processing fast Microscopy fast Electrons Electron microscopes Microscopy Image processing Hawkes, P. W. Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/130 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 130 SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopes fast Electrons fast Image processing fast Microscopy fast Electrons Electron microscopes Microscopy Image processing |
| title | Advances in imaging and electron physics, Volume 130 |
| title_auth | Advances in imaging and electron physics, Volume 130 |
| title_exact_search | Advances in imaging and electron physics, Volume 130 |
| title_full | Advances in imaging and electron physics, Volume 130 edited by Peter W. Hawkes |
| title_fullStr | Advances in imaging and electron physics, Volume 130 edited by Peter W. Hawkes |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 130 edited by Peter W. Hawkes |
| title_short | Advances in imaging and electron physics, Volume 130 |
| title_sort | advances in imaging and electron physics volume 130 |
| topic | SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopes fast Electrons fast Image processing fast Microscopy fast Electrons Electron microscopes Microscopy Image processing |
| topic_facet | SCIENCE / Physics / Electromagnetism SCIENCE / Physics / Electricity Electron microscopes Electrons Image processing Microscopy |
| url | http://www.sciencedirect.com/science/bookseries/10765670/130 |
| work_keys_str_mv | AT hawkespw advancesinimagingandelectronphysicsvolume130 |