Advances in imaging and electron physics, Volume 142:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
San Diego
Academic Press
©2006
|
| Series: | Advances in imaging and electron physics
v. 142 |
| Subjects: | |
| Online Access: | FAW01 Volltext |
| Item Description: | Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains |
| Physical Description: | xiv, 336 pages |
| ISBN: | 0080462839 9780080462837 012014784X 9780120147847 |
Staff View
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044383719 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s2006 |||| o||u| ||||||eng d | ||
| 020 | |a 0080462839 |9 0-08-046283-9 | ||
| 020 | |a 9780080462837 |9 978-0-08-046283-7 | ||
| 020 | |a 012014784X |9 0-12-014784-X | ||
| 020 | |a 9780120147847 |9 978-0-12-014784-7 | ||
| 035 | |a (ZDB-33-ESD)ocm77234481 | ||
| 035 | |a (OCoLC)77234481 | ||
| 035 | |a (DE-599)BVBBV044383719 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 537.5/6 |2 22 | |
| 245 | 1 | 0 | |a Advances in imaging and electron physics, Volume 142 |c edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey] |
| 264 | 1 | |a San Diego |b Academic Press |c ©2006 | |
| 300 | |a xiv, 336 pages | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Advances in imaging and electron physics |v v. 142 | |
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains | ||
| 650 | 7 | |a SCIENCE / Physics / Electromagnetism |2 bisacsh | |
| 650 | 7 | |a SCIENCE / Physics / Electricity |2 bisacsh | |
| 650 | 7 | |a Electron microscopes |2 fast | |
| 650 | 7 | |a Electrons |2 fast | |
| 650 | 7 | |a Image processing |2 fast | |
| 650 | 7 | |a Microscopy |2 fast | |
| 650 | 4 | |a Electrons | |
| 650 | 4 | |a Electron microscopes | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Image processing | |
| 700 | 1 | |a Hawkes, P. W. |e Sonstige |4 oth | |
| 700 | 1 | |a Kazan, Benjamin |e Sonstige |4 oth | |
| 700 | 1 | |a Mulvey, Thomas |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/bookseries/10765670/142 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029785940 | ||
| 966 | e | |u http://www.sciencedirect.com/science/bookseries/10765670/142 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Record in the Search Index
| _version_ | 1804177649167237120 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044383719 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocm77234481 (OCoLC)77234481 (DE-599)BVBBV044383719 |
| dewey-full | 537.5/6 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.5/6 |
| dewey-search | 537.5/6 |
| dewey-sort | 3537.5 16 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02385nmm a2200529zcb4500</leader><controlfield tag="001">BV044383719</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s2006 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080462839</subfield><subfield code="9">0-08-046283-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080462837</subfield><subfield code="9">978-0-08-046283-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">012014784X</subfield><subfield code="9">0-12-014784-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780120147847</subfield><subfield code="9">978-0-12-014784-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocm77234481</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)77234481</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044383719</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">537.5/6</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advances in imaging and electron physics, Volume 142</subfield><subfield code="c">edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">San Diego</subfield><subfield code="b">Academic Press</subfield><subfield code="c">©2006</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiv, 336 pages</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advances in imaging and electron physics</subfield><subfield code="v">v. 142</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Electromagnetism</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Electricity</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron microscopes</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electrons</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Image processing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrons</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopes</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Image processing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hawkes, P. W.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kazan, Benjamin</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mulvey, Thomas</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/142</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029785940</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/bookseries/10765670/142</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV044383719 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:26Z |
| institution | BVB |
| isbn | 0080462839 9780080462837 012014784X 9780120147847 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029785940 |
| oclc_num | 77234481 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | xiv, 336 pages |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | Academic Press |
| record_format | marc |
| series2 | Advances in imaging and electron physics |
| spelling | Advances in imaging and electron physics, Volume 142 edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey] San Diego Academic Press ©2006 xiv, 336 pages txt rdacontent c rdamedia cr rdacarrier Advances in imaging and electron physics v. 142 Includes bibliographical references and index Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopes fast Electrons fast Image processing fast Microscopy fast Electrons Electron microscopes Microscopy Image processing Hawkes, P. W. Sonstige oth Kazan, Benjamin Sonstige oth Mulvey, Thomas Sonstige oth http://www.sciencedirect.com/science/bookseries/10765670/142 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Advances in imaging and electron physics, Volume 142 SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopes fast Electrons fast Image processing fast Microscopy fast Electrons Electron microscopes Microscopy Image processing |
| title | Advances in imaging and electron physics, Volume 142 |
| title_auth | Advances in imaging and electron physics, Volume 142 |
| title_exact_search | Advances in imaging and electron physics, Volume 142 |
| title_full | Advances in imaging and electron physics, Volume 142 edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey] |
| title_fullStr | Advances in imaging and electron physics, Volume 142 edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey] |
| title_full_unstemmed | Advances in imaging and electron physics, Volume 142 edited by Peter W. Hawkes ; [associate editors Benjamin Kazan, Tom Mulvey] |
| title_short | Advances in imaging and electron physics, Volume 142 |
| title_sort | advances in imaging and electron physics volume 142 |
| topic | SCIENCE / Physics / Electromagnetism bisacsh SCIENCE / Physics / Electricity bisacsh Electron microscopes fast Electrons fast Image processing fast Microscopy fast Electrons Electron microscopes Microscopy Image processing |
| topic_facet | SCIENCE / Physics / Electromagnetism SCIENCE / Physics / Electricity Electron microscopes Electrons Image processing Microscopy |
| url | http://www.sciencedirect.com/science/bookseries/10765670/142 |
| work_keys_str_mv | AT hawkespw advancesinimagingandelectronphysicsvolume142 AT kazanbenjamin advancesinimagingandelectronphysicsvolume142 AT mulveythomas advancesinimagingandelectronphysicsvolume142 |