Electron nano-imaging: basics of imaging and diffraction for TEM and STEM
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer
[2017]
|
| Schlagworte: | |
| Online-Zugang: | BTU01 TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (xxviii, 333 Seiten) Illustrationen, Diagramme (teilweise farbig) |
| ISBN: | 9784431565024 |
| DOI: | 10.1007/978-4-431-56502-4 |
Internformat
MARC
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| 245 | 1 | 0 | |a Electron nano-imaging |b basics of imaging and diffraction for TEM and STEM |c Nobuo Tanaka |
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| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Nanoscale science | |
| 650 | 4 | |a Nanoscience | |
| 650 | 4 | |a Nanostructures | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
| 650 | 4 | |a Nanoscale Science and Technology | |
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Datensatz im Suchindex
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| any_adam_object | |
| author | Tanaka, Nobuo 1949- |
| author_GND | (DE-588)1063671906 |
| author_facet | Tanaka, Nobuo 1949- |
| author_role | aut |
| author_sort | Tanaka, Nobuo 1949- |
| author_variant | n t nt |
| building | Verbundindex |
| bvnumber | BV044291353 |
| classification_rvk | UH 6300 |
| classification_tum | CHE 000 |
| collection | ZDB-2-CMS |
| ctrlnum | (ZDB-2-CMS)9784431565024 (OCoLC)985978724 (DE-599)BVBBV044291353 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Chemie |
| doi_str_mv | 10.1007/978-4-431-56502-4 |
| format | Electronic eBook |
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| id | DE-604.BV044291353 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:48:53Z |
| institution | BVB |
| isbn | 9784431565024 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029695455 |
| oclc_num | 985978724 |
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| owner_facet | DE-634 DE-91 DE-BY-TUM DE-188 DE-11 |
| physical | 1 Online-Ressource (xxviii, 333 Seiten) Illustrationen, Diagramme (teilweise farbig) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2017 |
| publishDate | 2017 |
| publishDateSearch | 2017 |
| publishDateSort | 2017 |
| publisher | Springer |
| record_format | marc |
| spelling | Tanaka, Nobuo 1949- Verfasser (DE-588)1063671906 aut Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka Tokyo Springer [2017] © 2017 1 Online-Ressource (xxviii, 333 Seiten) Illustrationen, Diagramme (teilweise farbig) txt rdacontent c rdamedia cr rdacarrier Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology Erscheint auch als Druck-Ausgabe 978-4-431-56500-0 https://doi.org/10.1007/978-4-431-56502-4 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Tanaka, Nobuo 1949- Electron nano-imaging basics of imaging and diffraction for TEM and STEM Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| title | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_auth | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_exact_search | Electron nano-imaging basics of imaging and diffraction for TEM and STEM |
| title_full | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_fullStr | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_full_unstemmed | Electron nano-imaging basics of imaging and diffraction for TEM and STEM Nobuo Tanaka |
| title_short | Electron nano-imaging |
| title_sort | electron nano imaging basics of imaging and diffraction for tem and stem |
| title_sub | basics of imaging and diffraction for TEM and STEM |
| topic | Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| topic_facet | Materials science Spectroscopy Nanoscale science Nanoscience Nanostructures Microscopy Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Spectroscopy/Spectrometry Nanoscale Science and Technology |
| url | https://doi.org/10.1007/978-4-431-56502-4 |
| work_keys_str_mv | AT tanakanobuo electronnanoimagingbasicsofimaginganddiffractionfortemandstem |