ISTFA 2006: proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH
ASM International
2006
|
| Subjects: | |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | xx, 524 p. |
| ISBN: | 9780871708441 0871708442 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044189571 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170220s2006 |||| o||u| ||||||eng d | ||
| 020 | |a 9780871708441 |c $165.00 |9 978-0-87170-844-1 | ||
| 020 | |a 0871708442 |c $165.00 |9 0-87170-844-2 | ||
| 035 | |a (ZDB-30-PAD)EBC3002430 | ||
| 035 | |a (ZDB-89-EBL)EBL3002430 | ||
| 035 | |a (OCoLC)646827312 | ||
| 035 | |a (DE-599)BVBBV044189571 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.381548 |2 23 | |
| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2006 |b proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| 246 | 1 | 3 | |a Proceedings of the 32nd International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c 2006 | |
| 300 | |a xx, 524 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 4 | |a Materials |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a ASM International |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029596362 | ||
Record in the Search Index
| _version_ | 1804177320704999424 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |
| author_sort | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> |
| building | Verbundindex |
| bvnumber | BV044189571 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC3002430 (ZDB-89-EBL)EBL3002430 (OCoLC)646827312 (DE-599)BVBBV044189571 |
| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381548 |
| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01633nmm a2200397zc 4500</leader><controlfield tag="001">BV044189571</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170220s2006 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780871708441</subfield><subfield code="c">$165.00</subfield><subfield code="9">978-0-87170-844-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0871708442</subfield><subfield code="c">$165.00</subfield><subfield code="9">0-87170-844-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC3002430</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL3002430</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)646827312</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044189571</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381548</subfield><subfield code="2">23</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA 2006</subfield><subfield code="b">proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of the 32nd International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">2006</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xx, 524 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029596362</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044189571 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:12Z |
| institution | BVB |
| isbn | 9780871708441 0871708442 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029596362 |
| oclc_num | 646827312 |
| open_access_boolean | |
| physical | xx, 524 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | ASM International |
| record_format | marc |
| spelling | International Symposium for Testing and Failure Analysis < 2006, Austin, Tex.> Verfasser aut ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2006 xx, 524 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth |
| spellingShingle | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| title_alt | Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| title_exact_search | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| title_full | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| title_fullStr | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| title_full_unstemmed | ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| title_short | ISTFA 2006 |
| title_sort | istfa 2006 proceedings of the 32nd international symposium for testing and failure analysis november 12 16 2006 renaissance austin hotel austin texas usa |
| title_sub | proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Materials Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT internationalsymposiumfortestingandfailureanalysis2006austintex istfa2006proceedingsofthe32ndinternationalsymposiumfortestingandfailureanalysisnovember12162006renaissanceaustinhotelaustintexasusa AT asminternational istfa2006proceedingsofthe32ndinternationalsymposiumfortestingandfailureanalysisnovember12162006renaissanceaustinhotelaustintexasusa AT internationalsymposiumfortestingandfailureanalysis2006austintex proceedingsofthe32ndinternationalsymposiumfortestingandfailureanalysis AT asminternational proceedingsofthe32ndinternationalsymposiumfortestingandfailureanalysis AT internationalsymposiumfortestingandfailureanalysis2006austintex conferenceproceedingsfromthe32ndinternationalsymposiumfortestingandfailureanalysis AT asminternational conferenceproceedingsfromthe32ndinternationalsymposiumfortestingandfailureanalysis |