Microelectronic failure analysis, 2002 supplement: desk reference
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2002
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | vi, 210 p. |
| ISBN: | 0871707691 9780871707697 |
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| 245 | 1 | 0 | |a Microelectronic failure analysis, 2002 supplement |b desk reference |c prepared under the direction of the Electronic Device Failure Analysis Society publications committee |
| 264 | 1 | |a Materials Park, OH |b ASM International |c c2002 | |
| 300 | |a vi, 210 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
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| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044182357 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:00Z |
| institution | BVB |
| isbn | 0871707691 9780871707697 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029589202 |
| oclc_num | 609419839 |
| open_access_boolean | |
| physical | vi, 210 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronic failure analysis, 2002 supplement desk reference prepared under the direction of the Electronic Device Failure Analysis Society publications committee Materials Park, OH ASM International c2002 vi, 210 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | Microelectronic failure analysis, 2002 supplement desk reference Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronic failure analysis, 2002 supplement desk reference |
| title_auth | Microelectronic failure analysis, 2002 supplement desk reference |
| title_exact_search | Microelectronic failure analysis, 2002 supplement desk reference |
| title_full | Microelectronic failure analysis, 2002 supplement desk reference prepared under the direction of the Electronic Device Failure Analysis Society publications committee |
| title_fullStr | Microelectronic failure analysis, 2002 supplement desk reference prepared under the direction of the Electronic Device Failure Analysis Society publications committee |
| title_full_unstemmed | Microelectronic failure analysis, 2002 supplement desk reference prepared under the direction of the Electronic Device Failure Analysis Society publications committee |
| title_short | Microelectronic failure analysis, 2002 supplement |
| title_sort | microelectronic failure analysis 2002 supplement desk reference |
| title_sub | desk reference |
| topic | Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | Electronic apparatus and appliances Testing Handbooks, manuals, etc Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| work_keys_str_mv | AT electronicdevicefailureanalysissociety microelectronicfailureanalysis2002supplementdeskreference |