ISTFA '98: proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH
ASM International
c1998
|
| Subjects: | |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | xix, 490 p. |
| ISBN: | 9780871706690 0871706695 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044182341 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s1998 |||| o||u| ||||||eng d | ||
| 020 | |a 9780871706690 |9 978-0-87170-669-0 | ||
| 020 | |a 0871706695 |9 0-87170-669-5 | ||
| 035 | |a (ZDB-30-PAD)EBC3002415 | ||
| 035 | |a (ZDB-89-EBL)EBL3002415 | ||
| 035 | |a (OCoLC)646817834 | ||
| 035 | |a (DE-599)BVBBV044182341 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.381548 |2 23 | |
| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 1998, Dallas, Tex.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA '98 |b proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas |c sponsored by ISFTA, ASM International |
| 246 | 1 | 3 | |a Proceedings of the 24th International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Conference proceedings from the 24th International Symposium for Testing and Failure Analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c c1998 | |
| 300 | |a xix, 490 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a ASM International |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029589186 | ||
Record in the Search Index
| _version_ | 1804177307829534720 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium for Testing and Failure Analysis < 1998, Dallas, Tex.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 1998, Dallas, Tex.> |
| author_sort | International Symposium for Testing and Failure Analysis < 1998, Dallas, Tex.> |
| building | Verbundindex |
| bvnumber | BV044182341 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC3002415 (ZDB-89-EBL)EBL3002415 (OCoLC)646817834 (DE-599)BVBBV044182341 |
| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381548 |
| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01595nmm a2200385zc 4500</leader><controlfield tag="001">BV044182341</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s1998 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780871706690</subfield><subfield code="9">978-0-87170-669-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0871706695</subfield><subfield code="9">0-87170-669-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC3002415</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL3002415</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)646817834</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044182341</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381548</subfield><subfield code="2">23</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis < 1998, Dallas, Tex.></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA '98</subfield><subfield code="b">proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas</subfield><subfield code="c">sponsored by ISFTA, ASM International</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of the 24th International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Conference proceedings from the 24th International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">c1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xix, 490 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029589186</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044182341 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:00Z |
| institution | BVB |
| isbn | 9780871706690 0871706695 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029589186 |
| oclc_num | 646817834 |
| open_access_boolean | |
| physical | xix, 490 p. |
| psigel | ZDB-30-PAD |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | ASM International |
| record_format | marc |
| spelling | International Symposium for Testing and Failure Analysis < 1998, Dallas, Tex.> Verfasser aut ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas sponsored by ISFTA, ASM International Proceedings of the 24th International Symposium for Testing and Failure Analysis Conference proceedings from the 24th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c1998 xix, 490 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth |
| spellingShingle | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas |
| title_alt | Proceedings of the 24th International Symposium for Testing and Failure Analysis Conference proceedings from the 24th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas |
| title_exact_search | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas |
| title_full | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas sponsored by ISFTA, ASM International |
| title_fullStr | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas sponsored by ISFTA, ASM International |
| title_full_unstemmed | ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas sponsored by ISFTA, ASM International |
| title_short | ISTFA '98 |
| title_sort | istfa 98 proceedings of the 24th international symposium for testing and failure analysis 15 19 november 1998 hyatt regency dfw dallas texas |
| title_sub | proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT internationalsymposiumfortestingandfailureanalysis1998dallastex istfa98proceedingsofthe24thinternationalsymposiumfortestingandfailureanalysis1519november1998hyattregencydfwdallastexas AT asminternational istfa98proceedingsofthe24thinternationalsymposiumfortestingandfailureanalysis1519november1998hyattregencydfwdallastexas AT internationalsymposiumfortestingandfailureanalysis1998dallastex proceedingsofthe24thinternationalsymposiumfortestingandfailureanalysis AT asminternational proceedingsofthe24thinternationalsymposiumfortestingandfailureanalysis AT internationalsymposiumfortestingandfailureanalysis1998dallastex conferenceproceedingsfromthe24thinternationalsymposiumfortestingandfailureanalysis AT asminternational conferenceproceedingsfromthe24thinternationalsymposiumfortestingandfailureanalysis |