ISTFA '99: proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH
ASM International
c1999
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| Subjects: | |
| Item Description: | Sponsored by EDFAS, ISTFA. Includes bibliographical references and index |
| Physical Description: | xvii, 486 p. |
| ISBN: | 0871706466 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044182331 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s1999 |||| o||u| ||||||eng d | ||
| 020 | |a 0871706466 |9 0-87170-646-6 | ||
| 035 | |a (ZDB-30-PAD)EBC3002404 | ||
| 035 | |a (ZDB-89-EBL)EBL3002404 | ||
| 035 | |a (OCoLC)906430341 | ||
| 035 | |a (DE-599)BVBBV044182331 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 1999, Santa Clara, Calif.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA '99 |b proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| 246 | 1 | 3 | |a Proceedings of the 25th International Symposium or Testing and Failure Analysis |
| 246 | 1 | 3 | |a Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c c1999 | |
| 300 | |a xvii, 486 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Sponsored by EDFAS, ISTFA. | ||
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a ASM International |e Sonstige |4 oth | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029589176 | ||
Record in the Search Index
| _version_ | 1804177307812757504 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium for Testing and Failure Analysis < 1999, Santa Clara, Calif.> |
| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 1999, Santa Clara, Calif.> |
| author_sort | International Symposium for Testing and Failure Analysis < 1999, Santa Clara, Calif.> |
| building | Verbundindex |
| bvnumber | BV044182331 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC3002404 (ZDB-89-EBL)EBL3002404 (OCoLC)906430341 (DE-599)BVBBV044182331 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01605nmm a2200385zc 4500</leader><controlfield tag="001">BV044182331</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s1999 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0871706466</subfield><subfield code="9">0-87170-646-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC3002404</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL3002404</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)906430341</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044182331</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis < 1999, Santa Clara, Calif.></subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA '99</subfield><subfield code="b">proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Proceedings of the 25th International Symposium or Testing and Failure Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">c1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvii, 486 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Sponsored by EDFAS, ISTFA.</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029589176</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV044182331 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:46:00Z |
| institution | BVB |
| isbn | 0871706466 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029589176 |
| oclc_num | 906430341 |
| open_access_boolean | |
| physical | xvii, 486 p. |
| psigel | ZDB-30-PAD |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | ASM International |
| record_format | marc |
| spelling | International Symposium for Testing and Failure Analysis < 1999, Santa Clara, Calif.> Verfasser aut ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California Proceedings of the 25th International Symposium or Testing and Failure Analysis Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c1999 xvii, 486 p. txt rdacontent c rdamedia cr rdacarrier Sponsored by EDFAS, ISTFA. Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| title_alt | Proceedings of the 25th International Symposium or Testing and Failure Analysis Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| title_exact_search | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| title_full | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| title_fullStr | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| title_full_unstemmed | ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| title_short | ISTFA '99 |
| title_sort | istfa 99 proceedings of the 25th international symposium for testing and failure analysis 14 18 november 1999 westin hotel santa clara california |
| title_sub | proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
| work_keys_str_mv | AT internationalsymposiumfortestingandfailureanalysis1999santaclaracalif istfa99proceedingsofthe25thinternationalsymposiumfortestingandfailureanalysis1418november1999westinhotelsantaclaracalifornia AT asminternational istfa99proceedingsofthe25thinternationalsymposiumfortestingandfailureanalysis1418november1999westinhotelsantaclaracalifornia AT electronicdevicefailureanalysissociety istfa99proceedingsofthe25thinternationalsymposiumfortestingandfailureanalysis1418november1999westinhotelsantaclaracalifornia AT internationalsymposiumfortestingandfailureanalysis1999santaclaracalif proceedingsofthe25thinternationalsymposiumortestingandfailureanalysis AT asminternational proceedingsofthe25thinternationalsymposiumortestingandfailureanalysis AT electronicdevicefailureanalysissociety proceedingsofthe25thinternationalsymposiumortestingandfailureanalysis AT internationalsymposiumfortestingandfailureanalysis1999santaclaracalif conferenceproceedingsfromthe25thinternationalsymposiumfortestingandfailureanalysis AT asminternational conferenceproceedingsfromthe25thinternationalsymposiumfortestingandfailureanalysis AT electronicdevicefailureanalysissociety conferenceproceedingsfromthe25thinternationalsymposiumfortestingandfailureanalysis |