ISTFA 2000: proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH
ASM International
c2000
|
| Subjects: | |
| Item Description: | "Sponsored by EDFAS, ISTFA" Includes bibliographical references and index |
| Physical Description: | xvi, 577 p. |
| ISBN: | 0871707012 |
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| isbn | 0871707012 |
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| spelling | International Symposium for Testing and Failure Analysis < 2000, Bellevue, Wash.> Verfasser aut ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington Proceedings of the 26th International Symposium or Testing and Failure Analysis Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis Materials Park, OH ASM International c2000 xvi, 577 p. txt rdacontent c rdamedia cr rdacarrier "Sponsored by EDFAS, ISTFA" Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM International Sonstige oth Electronic Device Failure Analysis Society Sonstige oth |
| spellingShingle | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| title_alt | Proceedings of the 26th International Symposium or Testing and Failure Analysis Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| title_exact_search | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| title_full | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| title_fullStr | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| title_full_unstemmed | ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| title_short | ISTFA 2000 |
| title_sort | istfa 2000 proceedings of the 26th international symposium for testing and failure analysis 12 16 november 2000 meydenbauer convention center bellevue washington |
| title_sub | proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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