Transient-induced latchup in CMOS integrated circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Wiley
c2009
|
| Schlagworte: | |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xiii, 249 p. |
| ISBN: | 9780470824078 |
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Datensatz im Suchindex
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| author | Ker, Ming-Dou |
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| id | DE-604.BV044141688 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:44:53Z |
| institution | BVB |
| isbn | 9780470824078 |
| language | English |
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| publishDate | 2009 |
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| publisher | Wiley |
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| spelling | Ker, Ming-Dou Verfasser aut Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu Singapore Wiley c2009 xiii, 249 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability Hsu, Sheng-Fu Sonstige oth |
| spellingShingle | Ker, Ming-Dou Transient-induced latchup in CMOS integrated circuits Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability |
| title | Transient-induced latchup in CMOS integrated circuits |
| title_auth | Transient-induced latchup in CMOS integrated circuits |
| title_exact_search | Transient-induced latchup in CMOS integrated circuits |
| title_full | Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu |
| title_fullStr | Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu |
| title_full_unstemmed | Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu |
| title_short | Transient-induced latchup in CMOS integrated circuits |
| title_sort | transient induced latchup in cmos integrated circuits |
| topic | Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability |
| topic_facet | Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability |
| work_keys_str_mv | AT kermingdou transientinducedlatchupincmosintegratedcircuits AT hsushengfu transientinducedlatchupincmosintegratedcircuits |