Beam effects, surface topography, and depth profiling in surface analysis:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
New York
Plenum Press
c1998
|
| Series: | Methods of surface characterization
v. 5 |
| Subjects: | |
| Item Description: | Includes bibliographical references and index |
| Physical Description: | xix, 430 p. |
| ISBN: | 0306458969 |
Staff View
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| 245 | 1 | 0 | |a Beam effects, surface topography, and depth profiling in surface analysis |c edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell |
| 264 | 1 | |a New York |b Plenum Press |c c1998 | |
| 300 | |a xix, 430 p. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 0 | |a Methods of surface characterization |v v. 5 | |
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Record in the Search Index
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| id | DE-604.BV044090954 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:43:24Z |
| institution | BVB |
| isbn | 0306458969 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029497799 |
| oclc_num | 229449306 |
| open_access_boolean | |
| physical | xix, 430 p. |
| psigel | ZDB-30-PAD |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Plenum Press |
| record_format | marc |
| series2 | Methods of surface characterization |
| spelling | Beam effects, surface topography, and depth profiling in surface analysis edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell New York Plenum Press c1998 xix, 430 p. txt rdacontent c rdamedia cr rdacarrier Methods of surface characterization v. 5 Includes bibliographical references and index Surfaces (Technology) Analysis Materials Effect of radiation on Festkörper (DE-588)4016918-2 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Festkörper (DE-588)4016918-2 s Oberflächenanalyse (DE-588)4172243-7 s 1\p DE-604 Czanderna, Alvin Warren 1930- Sonstige oth Madey, Theodore E. Sonstige oth Powell, C. J. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Beam effects, surface topography, and depth profiling in surface analysis Surfaces (Technology) Analysis Materials Effect of radiation on Festkörper (DE-588)4016918-2 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4016918-2 (DE-588)4172243-7 |
| title | Beam effects, surface topography, and depth profiling in surface analysis |
| title_auth | Beam effects, surface topography, and depth profiling in surface analysis |
| title_exact_search | Beam effects, surface topography, and depth profiling in surface analysis |
| title_full | Beam effects, surface topography, and depth profiling in surface analysis edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell |
| title_fullStr | Beam effects, surface topography, and depth profiling in surface analysis edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell |
| title_full_unstemmed | Beam effects, surface topography, and depth profiling in surface analysis edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell |
| title_short | Beam effects, surface topography, and depth profiling in surface analysis |
| title_sort | beam effects surface topography and depth profiling in surface analysis |
| topic | Surfaces (Technology) Analysis Materials Effect of radiation on Festkörper (DE-588)4016918-2 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Surfaces (Technology) Analysis Materials Effect of radiation on Festkörper Oberflächenanalyse |
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