ISTFA 2013: conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, Ohio
ASM International
2013
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| Subjects: | |
| Item Description: | Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2014) |
| Physical Description: | 1 online resource (633 pages) color illustrations, charts, photographs, graphs, tables |
| ISBN: | 9781627080224 9781627080231 |
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Record in the Search Index
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| illustrated | Illustrated |
| indexdate | 2024-07-10T07:42:53Z |
| institution | BVB |
| isbn | 9781627080224 9781627080231 |
| language | English |
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| publishDate | 2013 |
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| publishDateSort | 2013 |
| publisher | ASM International |
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| spelling | International Symposium for Testing and Failure Analysis < 2013, San Jose, California> Verfasser aut ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA sponsored by Electronic Device Failure Analysis Society Materials Park, Ohio ASM International 2013 © 2013 1 online resource (633 pages) color illustrations, charts, photographs, graphs, tables txt rdacontent c rdamedia cr rdacarrier Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2014) Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Electronic Device Failure Analysis SocietyXXesponsor Sonstige oth Erscheint auch als Druck-Ausgabe International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California) ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA. |
| spellingShingle | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA |
| title_auth | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA |
| title_exact_search | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA |
| title_full | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA sponsored by Electronic Device Failure Analysis Society |
| title_fullStr | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA sponsored by Electronic Device Failure Analysis Society |
| title_full_unstemmed | ISTFA 2013 conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA sponsored by Electronic Device Failure Analysis Society |
| title_short | ISTFA 2013 |
| title_sort | istfa 2013 conference proceedings from the 39th international symposium for testing and failure analysis november 3 7 2013 san jose convention center san jose california usa |
| title_sub | conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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