Defects-recognition, imaging and physics in semiconductors XIV: selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Durnten-Zurich ; Enfield, NH
Trans Tech Publications
[2012]
|
| Schriftenreihe: | Materials science forum
vol. 725 |
| Schlagworte: | |
| Beschreibung: | Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013) |
| Beschreibung: | 1 online resource (300 pages) |
| ISBN: | 9783038138563 9783037854426 |
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| indexdate | 2024-07-10T07:42:48Z |
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| isbn | 9783038138563 9783037854426 |
| language | English |
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| spelling | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors < 2011, Miyazaki-shi, Japan> Verfasser aut Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai Durnten-Zurich ; Enfield, NH Trans Tech Publications [2012] © 2012 1 online resource (300 pages) txt rdacontent c rdamedia cr rdacarrier Materials science forum vol. 725 Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013) Semiconductors Defects Congresses Physics Congresses (DE-588)1071861417 Konferenzschrift gnd-content Yamada-Kaneta, Hiroshi Sonstige oth Sakai, Akira Sonstige oth |
| spellingShingle | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan Semiconductors Defects Congresses Physics Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan |
| title_auth | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan |
| title_exact_search | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan |
| title_full | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai |
| title_fullStr | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai |
| title_full_unstemmed | Defects-recognition, imaging and physics in semiconductors XIV selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan edited by Hiroshi Yamada-Kaneta and Akira Sakai |
| title_short | Defects-recognition, imaging and physics in semiconductors XIV |
| title_sort | defects recognition imaging and physics in semiconductors xiv selected peer reviewed papers from the 14th international conference on defects recognition imaging and physics in semiconductors september 25 29 2011 miyazaki japan |
| title_sub | selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan |
| topic | Semiconductors Defects Congresses Physics Congresses |
| topic_facet | Semiconductors Defects Congresses Physics Congresses Konferenzschrift |
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