ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis: November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, Ohio
ASM International
[2015]
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| Subjects: | |
| Item Description: | Cover title Description based on online resource; title from PDF title page (ebrary, viewed March 14, 2016) |
| Physical Description: | 1 online resource (536 pages) illustrations (some color) |
| ISBN: | 9781627081023 9781627081030 |
Staff View
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| illustrated | Illustrated |
| indexdate | 2024-07-10T07:42:28Z |
| institution | BVB |
| isbn | 9781627081023 9781627081030 |
| language | English |
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| publishDate | 2015 |
| publishDateSearch | 2015 |
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| publisher | ASM International |
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| spelling | International Symposium for Testing and Failure Analysis < 2015, Portland, Oregon> Verfasser aut ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International Materials Park, Ohio ASM International [2015] © 2015 1 online resource (536 pages) illustrations (some color) txt rdacontent c rdamedia cr rdacarrier Cover title Description based on online resource; title from PDF title page (ebrary, viewed March 14, 2016) Electronics Materials Testing Congresses Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Semiconductors Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content ASM InternationalXXeorganizer Sonstige oth Electronic Device Failure Analysis SocietyXXeorganizer Sonstige oth |
| spellingShingle | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA Electronics Materials Testing Congresses Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Semiconductors Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA |
| title_auth | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA |
| title_exact_search | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA |
| title_full | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International |
| title_fullStr | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International |
| title_full_unstemmed | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International |
| title_short | ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis |
| title_sort | istfa 2015 conference proceedings from the 41st international symposium for testing and failure analysis november 1 5 2015 oregon convention center portland oregon usa |
| title_sub | November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA |
| topic | Electronics Materials Testing Congresses Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Semiconductors Testing Congresses |
| topic_facet | Electronics Materials Testing Congresses Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Semiconductors Testing Congresses Konferenzschrift |
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