Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices
Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in d...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Somerset
Wiley
2013
|
Ausgabe: | 1st ed |
Schlagworte: | |
Online-Zugang: | Buchcover |
Zusammenfassung: | Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world's first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews "Semiconductor L. |
Beschreibung: | Description based on publisher supplied metadata and other sources |
Beschreibung: | 1 online resource (547 pages) |
ISBN: | 9781118481868 9781119990338 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV044049938 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 170217s2013 |||| o||u| ||||||eng d | ||
020 | |a 9781118481868 |9 978-1-118-48186-8 | ||
020 | |a 9781119990338 |c Print |9 978-1-119-99033-8 | ||
035 | |a (ZDB-30-PAD)EBC1118506 | ||
035 | |a (ZDB-89-EBL)EBL1118506 | ||
035 | |a (ZDB-38-EBR)ebr10653870 | ||
035 | |a (OCoLC)828735207 | ||
035 | |a (DE-599)BVBBV044049938 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
082 | 0 | |a 621.366 | |
100 | 1 | |a Epperlein, Peter W. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Semiconductor Laser Engineering, Reliability and Diagnostics |b A Practical Approach to High Power and Single Mode Devices |
250 | |a 1st ed | ||
264 | 1 | |a Somerset |b Wiley |c 2013 | |
264 | 4 | |c © 2013 | |
300 | |a 1 online resource (547 pages) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
500 | |a Description based on publisher supplied metadata and other sources | ||
520 | |a Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world's first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews "Semiconductor L. | ||
650 | 4 | |a Ingenieurwissenschaften | |
650 | 4 | |a Engineering | |
650 | 4 | |a Laser engineering | |
650 | 4 | |a Semiconductor lasers | |
650 | 0 | 7 | |a Halbleiterlaser |0 (DE-588)4139556-6 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Halbleiterlaser |0 (DE-588)4139556-6 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Epperlein, Peter W |t . Semiconductor Laser Engineering, Reliability and Diagnostics : A Practical Approach to High Power and Single Mode Devices |
856 | 4 | 2 | |m SWB Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029456783&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Buchcover |
912 | |a ZDB-30-PAD |a ZDB-38-ESG | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-029456783 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804177066864672768 |
---|---|
any_adam_object | 1 |
author | Epperlein, Peter W. |
author_facet | Epperlein, Peter W. |
author_role | aut |
author_sort | Epperlein, Peter W. |
author_variant | p w e pw pwe |
building | Verbundindex |
bvnumber | BV044049938 |
collection | ZDB-30-PAD ZDB-38-ESG |
ctrlnum | (ZDB-30-PAD)EBC1118506 (ZDB-89-EBL)EBL1118506 (ZDB-38-EBR)ebr10653870 (OCoLC)828735207 (DE-599)BVBBV044049938 |
dewey-full | 621.366 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.366 |
dewey-search | 621.366 |
dewey-sort | 3621.366 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 1st ed |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03837nmm a2200481zc 4500</leader><controlfield tag="001">BV044049938</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2013 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781118481868</subfield><subfield code="9">978-1-118-48186-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119990338</subfield><subfield code="c">Print</subfield><subfield code="9">978-1-119-99033-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC1118506</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL1118506</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-EBR)ebr10653870</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)828735207</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044049938</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.366</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Epperlein, Peter W.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Semiconductor Laser Engineering, Reliability and Diagnostics</subfield><subfield code="b">A Practical Approach to High Power and Single Mode Devices</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Somerset</subfield><subfield code="b">Wiley</subfield><subfield code="c">2013</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (547 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world's first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews "Semiconductor L.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Laser engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor lasers</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterlaser</subfield><subfield code="0">(DE-588)4139556-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterlaser</subfield><subfield code="0">(DE-588)4139556-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Epperlein, Peter W</subfield><subfield code="t">. Semiconductor Laser Engineering, Reliability and Diagnostics : A Practical Approach to High Power and Single Mode Devices</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">SWB Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029456783&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Buchcover</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029456783</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
id | DE-604.BV044049938 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T07:42:10Z |
institution | BVB |
isbn | 9781118481868 9781119990338 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029456783 |
oclc_num | 828735207 |
open_access_boolean | |
physical | 1 online resource (547 pages) |
psigel | ZDB-30-PAD ZDB-38-ESG |
publishDate | 2013 |
publishDateSearch | 2013 |
publishDateSort | 2013 |
publisher | Wiley |
record_format | marc |
spelling | Epperlein, Peter W. Verfasser aut Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices 1st ed Somerset Wiley 2013 © 2013 1 online resource (547 pages) txt rdacontent c rdamedia cr rdacarrier Description based on publisher supplied metadata and other sources Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world's first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews "Semiconductor L. Ingenieurwissenschaften Engineering Laser engineering Semiconductor lasers Halbleiterlaser (DE-588)4139556-6 gnd rswk-swf Halbleiterlaser (DE-588)4139556-6 s 1\p DE-604 Erscheint auch als Druck-Ausgabe Epperlein, Peter W . Semiconductor Laser Engineering, Reliability and Diagnostics : A Practical Approach to High Power and Single Mode Devices SWB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029456783&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Buchcover 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Epperlein, Peter W. Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices Ingenieurwissenschaften Engineering Laser engineering Semiconductor lasers Halbleiterlaser (DE-588)4139556-6 gnd |
subject_GND | (DE-588)4139556-6 |
title | Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices |
title_auth | Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices |
title_exact_search | Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices |
title_full | Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices |
title_fullStr | Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices |
title_full_unstemmed | Semiconductor Laser Engineering, Reliability and Diagnostics A Practical Approach to High Power and Single Mode Devices |
title_short | Semiconductor Laser Engineering, Reliability and Diagnostics |
title_sort | semiconductor laser engineering reliability and diagnostics a practical approach to high power and single mode devices |
title_sub | A Practical Approach to High Power and Single Mode Devices |
topic | Ingenieurwissenschaften Engineering Laser engineering Semiconductor lasers Halbleiterlaser (DE-588)4139556-6 gnd |
topic_facet | Ingenieurwissenschaften Engineering Laser engineering Semiconductor lasers Halbleiterlaser |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029456783&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT epperleinpeterw semiconductorlaserengineeringreliabilityanddiagnosticsapracticalapproachtohighpowerandsinglemodedevices |